Seeing atoms with aberration-corrected sub-Ångström electron microscopy

Ultramicroscopy

Volumn 108, Issue 3, 2008, Pages 196-209

  O'Keefe, Michael A ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Aberration correction; Contrast transfer theory; HRTEM; Sub ngstr m resolution

Indexed keywords

ABERRATIONS; COMPUTER SOFTWARE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGE ANALYSIS;

ABERRATION CORRECTION; CONTRAST TRANSFER THEORY;

ATOMS;

ARTICLE; ATOM; ELECTRON BEAM; ELECTRON MICROSCOPY; IMAGE ANALYSIS; IMAGE QUALITY; IMAGING SYSTEM;

EID: 38549083181     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.07.009     Document Type: Article

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