Outline of an ultracorrector compensating for all primary chromatic and geometrical aberrations of charged-particle lenses

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 519, Issue 1-2, 2004, Pages 12-27

  Rose, Harald ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Chromatic aberration; Eikonal; Geometrical aberrations; Quadrupole septuplet; Ultracorrector

Indexed keywords

ABERRATIONS; CHARGED PARTICLES; ELECTRIC FIELD EFFECTS; GEOMETRICAL OPTICS; LENSES; LIGHT SCATTERING; MAGNETIC FIELD EFFECTS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

CHROMATIC ABERRATIONS; EIKONAL; GEOMETRICAL ABERRATIONS; QUADRUPOLE SEPTUPLETS; ULTRACORRECTORS;

NUCLEAR INSTRUMENTATION;

EID: 1042304378     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2003.11.115     Document Type: Conference Paper

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