STEM tomography for thick biological specimens

Ultramicroscopy

Volumn 109, Issue 1, 2008, Pages 70-80

  Aoyama, Kazuhiro ^a   Takagi, Tomoko ^a,b   Hirase, Ai ^c,d   Miyazawa, Atsuo ^c,d  

^a Thermo Fisher Scientific   (United States)

^b JAPAN WOMEN'S UNIVERSITY   (Japan)

^c Harima Institute ^*  (Japan)

^d JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Collection angle; Electron tomography; HAADF STEM; Thick biological specimens

Indexed keywords

ABS RESINS; CELL CULTURE; ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTRON BEAMS; ELECTRON MICROSCOPES; ELECTRONS; MEDICAL IMAGING; MICROSCOPIC EXAMINATION; RESINS; SCANNING ELECTRON MICROSCOPY; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

BIOLOGICAL SPECIMENS; COLLECTION ANGLE; COLLECTION ANGLES; CONVENTIONAL TRANSMISSION ELECTRON MICROSCOPIES; DARK FIELDS; DYNAMIC FOCUSING; EASE OF USING; ELECTRON TOMOGRAPHY; HAADF-STEM; HEK293 CELLS; IRRADIATION DAMAGES; LINEAR CONTRASTS; PRIMARY CULTURES; SCANNING TRANSMISSION ELECTRON MICROSCOPIES; SPECIMEN THICKNESSES; THICK BIOLOGICAL SPECIMENS; THREE DIMENSIONS; TILT ANGLES; YEAST CELLS;

DIAGNOSTIC RADIOGRAPHY;

ANIMAL CELL; ARTICLE; CELL STRAIN HEK293; CONTROLLED STUDY; ELECTRON BEAM; ELECTRON RADIATION; NONHUMAN; QUANTITATIVE ANALYSIS; RAT; SCANNING TRANSMISSION ELECTRON MICROSCOPY; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

CELL LINE; CELLS; HUMANS; MICROSCOPY, ELECTRON, SCANNING TRANSMISSION; MICROSCOPY, ELECTRON, TRANSMISSION; NEURONS; SCHIZOSACCHAROMYCES;

EID: 55949119220     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.08.005     Document Type: Article

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