Atomic Structure Imaging beyond Conventional Resolution Limits in the Transmission Electron Microscope

Physical Review Letters

Volumn 103, Issue 12, 2009, Pages

  Haigh, Sarah J ^a   Sawada, Hidetaka ^b   Kirkland, Angus I ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b JEOL LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SCALE; ATOMIC STRUCTURE; AXIAL IMAGING; LOCAL STRUCTURE; PARTIAL COHERENCE; REAL-SPACE RESOLUTION; RESOLUTION LIMITS; TRANSMISSION ELECTRON MICROSCOPE;

ELECTRON BEAMS; ELECTRON MICROSCOPES; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRONS;

EID: 70349272274     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.103.126101     Document Type: Article

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