Direct sub-angstrom imaging of a crystal lattice

Science

Volumn 305, Issue 5691, 2004, Pages 1741-

  Nellist, P D ^a   Chisholm, M F ^b   Dellby, N ^a   Krivanek, O L ^a   Murfitt, M F ^a   Szilagyi, Z S ^a   Lupini, A R ^b   Borisevich, A ^b   Sides Jr , W H ^b   Pennycook, S J ^b  

^a Nion Co Kirkland   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

CRYSTALLOGRAPHY;

ARTICLE; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; IMAGING; LIGHT SCATTERING; PARTICLE SIZE; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; STRUCTURE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 19344362666     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.1100965     Document Type: Article

References (7)

1. T. Kawasaki et al., Appl. Phys. Lett. 76, 1342 (2000).
2. P. D. Nellist, S. J. Pennycook, Phys. Rev. Lett. 81, 4156 (1998).
3. M. A. O'Keefe et al., Ultramicroscopy 89, 215 (2001).
4. M. A. O'Keefe, E. C. Nelson, Y. C. Wang, A. Thust, Philos. Mag. B 81, 1861 (2001).
5. P. E. Batson, N. Dellby, O. L. Krivanek, Nature 418, 617 (2002).
6. Materials and Methods are available as supporting material on Science online.
7. This research was sponsored by the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory (ORNL), managed by UT-Battelle LLC for the U.S. Department of Energy under contract no. DE-AC05-00OR22725, and by an appointment to the ORNL Postdoctoral Research Program administered jointly by ORNL and the Oak Ridge Institute for Science and Education.