Energy resolution of an Omega-type monochromator and imaging properties of the MANDOLINE filter

Ultramicroscopy

Volumn 110, Issue 8, 2010, Pages 971-980

  Essers, Erik ^a   Benner, Gerd ^a   Mandler, Thilo ^a   Meyer, Stefan ^a   Mittmann, Dieter ^a   Schnell, Michael ^a   Höschen, Rainer ^b  

^a CARL ZEISS SMT AG   (Germany)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Corrected OMEGA filter; EELS; Energy resolution; Energy filtered imaging; Imaging energy filter; MANDOLINE filter; Monochromator; Transmissivity

Indexed keywords

ENERGY RESOLUTIONS; ENERGY-FILTERED IMAGING; IMAGING ENERGY FILTERS; OMEGA FILTER; TRANSMISSIVITY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

MONOCHROMATORS;

ARTICLE; COLORIMETRY; ELECTRIC POTENTIAL; ENERGY; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; EQUIPMENT DESIGN; FILTER; HIGH RESOLUTION COMPUTER TOMOGRAPHY; MAGNETIC ABERRATION FREE NOTICEABLY DISPERSIVE OMEGA LIKE INHOMOGENOUS ENERGY FILTER; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPECTRUM; TRANSMISSION ELECTRON MICROSCOPY;

EID: 77955517347     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.02.009     Document Type: Article

References (21)

1. Kimoto K., Kothleitner G., Grogger W., Matsui Y., Hofer F. Micron 2005, 36:185.
2. Sigle W., Nelayah J., Koch C.T., van Aken P.A. Opt. Lett. 2009, 34:2150.
3. Uhlemann S., Rose H. Optik 1994, 96:163.
4. Rühle M., Elsässer C., Scheu C., Sigle W. Microsc. Microanal. 2000, 6(Suppl. 2: Proceedings):188.
5. Gu L., Sigle W., Koch C.T., Nelayah J., Srot V., van Aken P.A. Ultramicroscopy 2009, 109:1164.
6. Koch C.T., Sigle W., Höschen R., Rühle M., Essers E., Benner G., Matijevic M. Microsc. Microanal. 2006, 12:506.
7. Rose H. Ultramicroscopy 1994, 56:11.
8. F. Kahl, Thesis, Technische Universität Darmstadt, 1999 http://deposit.ddb.de/cgi-bin/dokserv?idn=960411011.
9. Rose H. Ultramicroscopy 1999, 78:13.
10. F. Kahl, H. Rose, Proceedings of the 12th European Congress on Electron Microscopy, vol. 3, 2000, p. 1459.
11. S. Uhlemann, M. Haider, Proceedings of the 15th International Congress on Electron Microscopy, vol. 3, 2002, p. 327.
12. S. Uhlemann, Private communication (2008).
13. M. Lentzen, A. Thust, Proceedings of the 16th International Congress on Electron Microscopy, vol. 2, 2006, p. 638.
14. Benner G., Probst W. J. Microsc. 1994, 174:133.
15. Gloter A., Douiri A., Tencé M., Colliex C. Ultramicroscopy 2003, 96:385.
16. Script provided by C.T. Koch, Max Planck Institute for Metals Research, Stuttgart.
17. Lazar S., Botton G.A., Zandbergen H.W. Ultramicroscopy 2006, 106:1091.
18. Zuo J.M. Microsc. Res. Tech. 2000, 49:245.
19. Sigle W., Krämer S., Varshney V., Zern A., Eigenthaler U., Rühle M. Ultramicroscopy 2003, 96:565.
20. Nelayah J., Gu L., Sigle W., Koch C.T., Pastoriza-Santos I., Liz-Marzán L.M., van Aken P.A. Opt. Lett. 2009, 34:1003.
21. Uhlemann S., Rose H. Ultramicroscopy 1996, 63:161.