Atomic-scale chemical imaging of composition and bonding by aberration-corrected microscopy

Science

Volumn 319, Issue 5866, 2008, Pages 1073-1076

  Muller, D A ^a   Fitting Kourkoutis, L ^a   Murfitt, M ^b   Song, J H ^c,d   Hwang, H Y ^d,e   Silcox, J ^a   Dellby, N ^b   Krivanek, O L ^b  

^a Cornell University   (United States)

^b Nion Co Kirkland   (United States)

^c Chungnam National University   (South Korea)

^d UNIVERSITY OF TOKYO   (Japan)

^e JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

LANTHANUM; MANGANESE OXIDE; STRONTIUM; TITANIUM DIOXIDE;

IMAGING METHOD; MANGANESE; MEASUREMENT METHOD; METAL BINDING; MICROSCOPY; SPECTROSCOPY; STRONTIUM; TITANIUM; TRANSMISSION ELECTRON MICROSCOPY;

ARTICLE; ARTIFACT REDUCTION; ATOM; CHEMICAL BOND; CHEMICAL COMPOSITION; ELECTRON ENERGY LOSS SPECTROSCOPY; IMAGE ANALYSIS; MOLECULAR IMAGING; PRIORITY JOURNAL; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

EID: 39749200807     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1148820     Document Type: Article

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23. The instrument was developed under NSF grant DMR-9977547 with an additional contribution from Cornell University. In-kind contributions were made by Gatan Inc., Sandia National Laboratory, Pacific Northwest Laboratory, and Bell Laboratories. Supported by NSF Nanoscale Science and Engineering Initiative grant EEC-0117770 (D.A.M. and J.S.), NSF Materials Research Science and Engineering Center grant DMR-0520404 (L.F.K.), the TEPCO Research Foundation (H.Y.H.), and the Japan Society for the Promotion of Science (J.H.S.).