Ordered liquid aluminum at the interface with sapphire

Science

Volumn 310, Issue 5748, 2005, Pages 661-663

  Oh, S H ^a   Kauffmann, Y ^b   Scheu, C ^a,c   Kaplan, W D ^b   Ruhle M ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^c UNIVERSITY OF LEOBEN   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; EPITAXIAL GROWTH; INTERFACES (MATERIALS); SAPPHIRE; SOLIDIFICATION; X RAY SCATTERING;

ATOMIC-LENGTH SCALE; ATOMISTIC SIMULATIONS; INTERFACIAL TRANSPORT; SOLID-LIQUID INTERFACES;

ALUMINUM;

ALUMINUM;

ALUMINUM; SAPPHIRE;

ARTICLE; CRYSTAL; LIQUID; MATERIAL STATE; PHYSICAL PHASE; PRIORITY JOURNAL; SOLID; TRANSMISSION ELECTRON MICROSCOPY;

EID: 27344438917     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1118611     Document Type: Article

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31. We thank F. Phillipp and J. M. Howe for discussions and U. Salzberger, R. Höschen, and J. Thomas for technical assistance. This work was partially funded by the German-Israel Fund (grant I-779-42.10/2003), the German Science Foundation through the Graduiertenkolleg Innere Grenzflächen (GRK 285/3), and the Russell Berrie Nanotechnology Institute at the Technion.