Radiation damage in the TEM and SEM

Micron

Volumn 35, Issue 6, 2004, Pages 399-409

  Egerton, R F ^a   Li, P ^a   Malac, M ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

Electron sputtering; Radiation damage; Radiolysis; Scanning electron microscope; Transmission electron microscope

Indexed keywords

CONFERENCE PAPER; ELECTRICITY; ELECTRON MICROSCOPY; RADIOLOGY; REPRODUCIBILITY; SCANNING ELECTRON MICROSCOPY; STANDARD;

ELECTROSTATICS; MICROSCOPY, ELECTRON; MICROSCOPY, ELECTRON, SCANNING; RADIOLOGY; REPRODUCIBILITY OF RESULTS;

EID: 2342561300     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2004.02.003     Document Type: Conference Paper

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