메뉴 건너뛰기




Volumn 71, Issue 1, 2008, Pages

Electron holography - Basics and applications

Author keywords

[No Author keywords available]

Indexed keywords


EID: 41849094851     PISSN: 00344885     EISSN: None     Source Type: Journal    
DOI: 10.1088/0034-4885/71/1/016102     Document Type: Article
Times cited : (315)

References (102)
  • 3
    • 34250925182 scopus 로고
    • Beobachtungen und Messungen an Biprisma-Interferenzen mit Elektronenwellen
    • Möllenstedt G and Düker H 1956 Beobachtungen und Messungen an Biprisma-Interferenzen mit Elektronenwellen Z. Phys. 145 377-97
    • (1956) Z. Phys. , vol.145 , Issue.3 , pp. 377-397
    • Möllenstedt, G.1    Düker, H.2
  • 4
    • 18144428788 scopus 로고    scopus 로고
    • Spin-dependent Fabry-Perot interference from a Cu thin film grown on fcc Co(0 0 1)
    • Wu Y Z, Schmid A K, Altman M S, Jin X F and Qiu Z Q 2005 Spin-dependent Fabry-Perot interference from a Cu thin film grown on fcc Co(0 0 1) Phys. Rev. Lett. 94 027201
    • (2005) Phys. Rev. Lett. , vol.94 , Issue.2 , pp. 027201
    • Wu, Y.Z.1    Schmid, A.K.2    Altman, M.S.3    Jin, X.F.4    Qiu, Z.Q.5
  • 6
    • 0008170209 scopus 로고
    • Schmid H 1985 Ein Elektronen-Interferometer mit 300 νm weit getrennten kohärenten Teilbündeln zur Erzeugung hoher Gangunterschiede und Messung der Phasenschiebung durch das magnetische Vektorpotential bei metallisch abgeschirmtem Magnetfluss Dissertation University of Tübingen
    • (1985) Dissertation
    • Schmid, H.1
  • 7
    • 0345887568 scopus 로고
    • Analytical representation of Hartree potentials and electron scattering
    • Byatt W J 1956 Analytical representation of Hartree potentials and electron scattering Phys. Rev. 104 1298
    • (1956) Phys. Rev. , vol.104 , Issue.5 , pp. 1298
    • Byatt, W.J.1
  • 10
    • 34250581092 scopus 로고
    • Messung des mittleren inneren Potentials von Be im Elektronen- Interferometer
    • Jönsson C, Hoffmann H and Möllenstedt G 1965 Messung des mittleren inneren Potentials von Be im Elektronen-Interferometer Phys. Kondens. Mater. 3 193
    • (1965) Phys. Kondens. Mater. , vol.3 , Issue.3 , pp. 193
    • Jönsson, C.1    Hoffmann, H.2    Möllenstedt, G.3
  • 11
    • 84945095094 scopus 로고
    • 0) and constraints on the electron density in crystals
    • 0) and constraints on the electron density in crystals Acta Cryst. A 50 33-45
    • (1994) Acta Cryst. , vol.50 , Issue.1 , pp. 33-45
    • O'Keefe, M.1    Spence, J.H.C.2
  • 12
    • 36149069852 scopus 로고
    • The refractive index in electron optics and the principles of dynamics
    • Ehrenberg W and Siday R E 1949 The refractive index in electron optics and the principles of dynamics Proc. Phys. Soc. Lond B 62 8-21
    • (1949) Proc. Phys. Soc. Lond , vol.62 , pp. 8-21
    • Ehrenberg, W.1    Siday, R.E.2
  • 13
    • 33748067017 scopus 로고
    • Significance of electromagnetic potentials in quantum theory
    • Aharonov Y and Bohm D 1959 Significance of electromagnetic potentials in quantum theory Phys. Rev. 115 485
    • (1959) Phys. Rev. , vol.115 , Issue.3 , pp. 485
    • Aharonov, Y.1    Bohm, D.2
  • 14
    • 0002501226 scopus 로고
    • Shift of an electron interference pattern by enclosed magnetic flux
    • Chambers R G 1960 Shift of an electron interference pattern by enclosed magnetic flux Phys. Rev. Lett. 5 3
    • (1960) Phys. Rev. Lett. , vol.5 , Issue.1 , pp. 3
    • Chambers, R.G.1
  • 15
    • 0001134760 scopus 로고
    • Kontinuierliche Phasenschiebung von Elektronenwellen im kraftfeldfreien Raum durch das magnetische Vektorpotential eines Solenoids
    • Möllenstedt G and Bayh W 1962 Kontinuierliche Phasenschiebung von Elektronenwellen im kraftfeldfreien Raum durch das magnetische Vektorpotential eines Solenoids Physikalische Bl. 18 299
    • (1962) Physikalische Bl. , vol.18 , pp. 299
    • Möllenstedt, G.1    Bayh, W.2
  • 16
  • 17
    • 36849115296 scopus 로고
    • Diffraction effects in Lorentz microscopy
    • Wohlleben D 1967 Diffraction effects in Lorentz microscopy J. Appl. Phys. 38 3341
    • (1967) J. Appl. Phys. , vol.38 , Issue.8 , pp. 3341
    • Wohlleben, D.1
  • 18
    • 0006571807 scopus 로고
    • Wave-optical aspects of Lorentz microscopy
    • Cohen M S 1967 Wave-optical aspects of Lorentz microscopy J. Appl. Phys. 38 4966
    • (1967) J. Appl. Phys. , vol.38 , Issue.13 , pp. 4966
    • Cohen, M.S.1
  • 19
    • 0001445727 scopus 로고
    • Holographic interference electron microscopy for determining specimen magnetic structure and thickness distribution
    • Tonomura A, Matsuda T, Endo J, Arii T and Mihama K 1986 Holographic interference electron microscopy for determining specimen magnetic structure and thickness distribution Phys. Rev. B 34 3397
    • (1986) Phys. Rev. , vol.34 , Issue.5 , pp. 3397
    • Tonomura, A.1    Matsuda, T.2    Endo, J.3    Arii, T.4    Mihama, K.5
  • 20
    • 0031260012 scopus 로고    scopus 로고
    • Interference experiments with energy filtered electrons
    • Harscher A, Lichte H and Mayer J 1997 Interference experiments with energy filtered electrons Ultramicroscopy 69 201-9
    • (1997) Ultramicroscopy , vol.69 , Issue.3 , pp. 201-209
    • Harscher, A.1    Lichte, H.2    Mayer, J.3
  • 21
    • 0034110033 scopus 로고    scopus 로고
    • Inelastic electron holography
    • Lichte H and Freitag B 2000 Inelastic electron holography Ultramicroscopy 81 177-86
    • (2000) Ultramicroscopy , vol.81 , Issue.3-4 , pp. 177-186
    • Lichte, H.1    Freitag, B.2
  • 23
    • 15744374289 scopus 로고    scopus 로고
    • Correlation and the density matrix approach to inelastic electron holography in solid state plasma
    • Schattschneider P and Lichte H 2005 Correlation and the density matrix approach to inelastic electron holography in solid state plasma Phys. Rev. B 71 045130
    • (2005) Phys. Rev. , vol.71 , pp. 045130
    • Schattschneider, P.1    Lichte, H.2
  • 25
    • 0018688356 scopus 로고
    • Image contrast and localised signal selection techniques
    • Howie A 1979 Image contrast and localised signal selection techniques J. Microsc. 117 11
    • (1979) J. Microsc. , vol.117 , pp. 11
    • Howie, A.1
  • 26
    • 0022221981 scopus 로고
    • Theory of image formation by inelastically scattered electrons in the electron microscope
    • Rose H and Kohl H 1985 Theory of image formation by inelastically scattered electrons in the electron microscope Adv. Electron. Electron Opt. 65 173
    • (1985) Adv. Electron. Electron Opt. , vol.65 , pp. 173
    • Rose, H.1    Kohl, H.2
  • 27
    • 38349103724 scopus 로고    scopus 로고
    • The Fresnel effect of a defocused biprism on the fringes in inelastic holography
    • Verbeeck J, Bertoni G and Schattschneider P The Fresnel effect of a defocused biprism on the fringes in inelastic holography Ultramicroscopy at press
    • Ultramicroscopy
    • Verbeeck, J.1    Bertoni, G.2    Schattschneider, P.3
  • 28
    • 0001183766 scopus 로고
    • Das Phasenkontrastverfahren bei der mikroskopischen Beobachtung
    • Zernike F 1935 Das Phasenkontrastverfahren bei der mikroskopischen Beobachtung Z. Tech. Phys. 16 454
    • (1935) Z. Tech. Phys. , vol.16 , pp. 454
    • Zernike, F.1
  • 29
    • 0242278253 scopus 로고
    • Ber einige Fehler von Elektronenlinsen
    • Scherzer O 1936 ber einige Fehler von Elektronenlinsen Z. Phys. 101 593-603
    • (1936) Z. Phys. , vol.101 , Issue.9-10 , pp. 593-603
    • Scherzer, O.1
  • 30
    • 0002170585 scopus 로고
    • The theoretical resolution limit of the electron microscope
    • Scherzer O 1949 The theoretical resolution limit of the electron microscope J. Appl. Phys. 20 20-9
    • (1949) J. Appl. Phys. , vol.20 , Issue.1 , pp. 20-29
    • Scherzer, O.1
  • 31
    • 0026244960 scopus 로고
    • Optimum focus for taking electron holograms
    • Lichte H 1991 Optimum focus for taking electron holograms Ultramicroscopy 38 13-22
    • (1991) Ultramicroscopy , vol.38 , Issue.1 , pp. 13-22
    • Lichte, H.1
  • 32
    • 0002685951 scopus 로고
    • Outline of a spherically corrected semiaplanatic medium- voltage transmission electron microscope
    • Rose H 1990 Outline of a spherically corrected semiaplanatic medium- voltage transmission electron microscope Optik 85 19-24
    • (1990) Optik , vol.85 , Issue.1 , pp. 19-24
    • Rose, H.1
  • 35
    • 0037423244 scopus 로고    scopus 로고
    • Atomic-resolution imaging of oxygen in perovskite ceramics
    • Jia C L, Lentzen M and Urban K 2003 Atomic-resolution imaging of oxygen in perovskite ceramics Science 299 870-3
    • (2003) Science , vol.299 , Issue.5608 , pp. 870-873
    • Jia, C.L.1    Lentzen, M.2    Urban, K.3
  • 36
    • 34250769340 scopus 로고
    • A new microscopic principle
    • Gabor D 1948 A new microscopic principle Nature 161 563-4
    • (1948) Nature , vol.161 , Issue.4098 , pp. 777-564
    • Gabor, D.1
  • 37
    • 0000763825 scopus 로고
    • Microscopy by reconstructed wave-fronts
    • Gabor D 1949 Microscopy by reconstructed wave-fronts Proc. R. Soc. A 197 454-87
    • (1949) Proc. R. Soc. , vol.197 , Issue.1051 , pp. 454-487
    • Gabor, D.1
  • 38
    • 0000067038 scopus 로고
    • Reconstructed wavefronts and communication theory
    • Leith E H and Upatnieks J 1962 Reconstructed wavefronts and communication theory J. Opt. Soc. Am. 52 1123-30
    • (1962) J. Opt. Soc. Am. , vol.52 , pp. 1123-1130
    • Leith, E.H.1    Upatnieks, J.2
  • 39
    • 0000703590 scopus 로고
    • The formation of diffraction image with electrons in the Gabor diffraction microscope
    • Haine M E and Mulvey T 1952 The formation of diffraction image with electrons in the Gabor diffraction microscope J. Opt. Soc. Am. 42 763
    • (1952) J. Opt. Soc. Am. , vol.42 , pp. 763
    • Haine, M.E.1    Mulvey, T.2
  • 40
    • 0000892875 scopus 로고
    • Elektronenholographie und Rekonstruktion mit Laserlicht
    • Möllenstedt G and Wahl H 1968 Elektronenholographie und Rekonstruktion mit Laserlicht Naturwissenschaften 55 340-1
    • (1968) Naturwissenschaften , vol.55 , Issue.7 , pp. 340-341
    • Möllenstedt, G.1    Wahl, H.2
  • 41
    • 41849133971 scopus 로고
    • Wahl H 1975 Bildebenenholographie mit Elektronen Thesis University of Tübingen
    • (1975) Thesis
    • Wahl, H.1
  • 42
    • 0026750132 scopus 로고
    • Twenty forms of electron holography
    • Cowley J M 1992 Twenty forms of electron holography Ultramicroscopy 41 335-48
    • (1992) Ultramicroscopy , vol.41 , Issue.4 , pp. 335-348
    • Cowley, J.M.1
  • 43
    • 0030221935 scopus 로고    scopus 로고
    • Electron holography: Optimum position of the biprism in the electron microscope
    • Lichte H 1996 Electron holography: optimum position of the biprism in the electron microscope Ultramicroscopy 64 79-86
    • (1996) Ultramicroscopy , vol.64 , Issue.1-4 , pp. 79-86
    • Lichte, H.1
  • 44
    • 0032190811 scopus 로고    scopus 로고
    • The effects of electron and photon scattering on signal and noise properties of scintillators in CCD cameras used for electron detection
    • Meyer R R and Kirkland A 1998 The effects of electron and photon scattering on signal and noise properties of scintillators in CCD cameras used for electron detection Ultramicroscopy 75 23-33
    • (1998) Ultramicroscopy , vol.75 , Issue.1 , pp. 23-33
    • Meyer, R.R.1    Kirkland, A.2
  • 45
    • 0023998263 scopus 로고
    • Statistics of phase and contrast determination in electron holograms
    • Lenz F 1988 Statistics of phase and contrast determination in electron holograms Optik 79 13-14
    • (1988) Optik , vol.79 , Issue.1 , pp. 13-14
    • Lenz, F.1
  • 46
    • 0023439882 scopus 로고
    • Electron noise in off-axis image plane holography
    • Lichte H, Herrmann K-H and Lenz F 1987 Electron noise in off-axis image plane holography Optik 77 135-40
    • (1987) Optik , vol.77 , Issue.3 , pp. 135-140
    • Lichte, H.1    Herrmann, K.-H.2    Lenz, F.3
  • 47
    • 0030221753 scopus 로고    scopus 로고
    • Experimental study of amplitude and phase detection limits in electron holography
    • Harscher A and Lichte H 1996 Experimental study of amplitude and phase detection limits in electron holography Ultramicroscopy 64 57-66
    • (1996) Ultramicroscopy , vol.64 , Issue.1-4 , pp. 57-66
    • Harscher, A.1    Lichte, H.2
  • 48
    • 38349092033 scopus 로고    scopus 로고
    • Performance limits of electron holography
    • Lichte H Performance limits of electron holography Ultramicroscopy at press
    • Ultramicroscopy
    • Lichte, H.1
  • 49
    • 0028399154 scopus 로고
    • Absolute measurement of normalized thickness, t/li, from off-axis electron holography
    • McCartney M R and Gajdardziska-Josifovska M 1994 Absolute measurement of normalized thickness, t/li, from off-axis electron holography Ultramicroscopy 53 283-9
    • (1994) Ultramicroscopy , vol.53 , Issue.3 , pp. 283-289
    • McCartney, M.R.1    Gajdardziska-Josifovska, M.2
  • 50
    • 27944448896 scopus 로고    scopus 로고
    • 2D-mapping of dopant distribution in deep sub micron CMOS devices by electron holography using adapted FIB-preparation
    • Lenk A, Lichte H and Muehle U 2005 2D-mapping of dopant distribution in deep sub micron CMOS devices by electron holography using adapted FIB-preparation J. Electron Microsc. 54 351-9
    • (2005) J. Electron Microsc. , vol.54 , Issue.4 , pp. 351-359
    • Lenk, A.1    Lichte, H.2    Muehle, U.3
  • 53
    • 33644499447 scopus 로고    scopus 로고
    • Three-dimensional electrostatic potential of a Si p-n junction revealed using tomographic electron holography
    • Twitchett A C, Yates T J V, Dunin-Borkowski R E, Newcomb S B and Midgley P A 2006 Three-dimensional electrostatic potential of a Si p-n junction revealed using tomographic electron holography J. Phys. Conf. Ser. 26 29
    • (2006) J. Phys. Conf. Ser. , vol.26 , Issue.1 , pp. 29
    • Twitchett, A.C.1    Yates, T.J.V.2    Dunin-Borkowski, R.E.3    Newcomb, S.B.4    Midgley, P.A.5
  • 54
    • 41849128185 scopus 로고    scopus 로고
    • Towards quantitative electron-holographic tomography
    • Wolf D 2007 Towards quantitative electron-holographic tomography Microsc. Microanal. (Suppl.) 13 112-13
    • (2007) Microsc. Microanal. (Suppl.) , vol.13 , pp. 112-113
    • Wolf, D.1
  • 56
    • 41849121200 scopus 로고    scopus 로고
    • Harscher A 1999 Electron holography of biological objects: basics and examples of applications PhD Thesis University Tübingen, Germany
    • (1999) PhD Thesis
    • Harscher, A.1
  • 57
    • 19944367022 scopus 로고    scopus 로고
    • Electron holography and AFM studies on styrenic block copolymers and a high impact polystyrene
    • Simon P, Adhikari R, Lichte H, Micheler G H and Langela M 2005 Electron holography and AFM studies on styrenic block copolymers and a high impact polystyrene J. Appl. Polym. Sci. 96 1573-83
    • (2005) J. Appl. Polym. Sci. , vol.96 , Issue.5 , pp. 1573-1583
    • Simon, P.1    Adhikari, R.2    Lichte, H.3    Micheler, G.H.4    Langela, M.5
  • 59
    • 41849145373 scopus 로고    scopus 로고
    • Formnek P 2005 TEM-holography on device structures in microelectronics PhD Thesis TU Cottbus
    • (2005) PhD Thesis
    • Formnek, P.1
  • 60
    • 33745943912 scopus 로고    scopus 로고
    • Intrinsic electric dipole fields and the induction of hierarchical form developments in fluorapatite-gelatine nanocomposites: A general pronciple for morphogenesis of biominerals?
    • Simon P, Zahn D, Lichte H and Kniep R 2006 Intrinsic electric dipole fields and the induction of hierarchical form developments in fluorapatite-gelatine nanocomposites: a general pronciple for morphogenesis of biominerals? Angew. Chem. Int. Ed. 45 1911-15
    • (2006) Angew. Chem. Int. Ed. , vol.45 , Issue.12 , pp. 1911-1915
    • Simon, P.1    Zahn, D.2    Lichte, H.3    Kniep, R.4
  • 61
    • 0001367051 scopus 로고
    • Electron holographic observations of the electrostatic field associated with thin reverse-biased p-n junctions
    • Frabboni S, Matteucci G and Pozzi G 1985 Electron holographic observations of the electrostatic field associated with thin reverse-biased p-n junctions Phys. Rev. Lett. 55 2196
    • (1985) Phys. Rev. Lett. , vol.55 , Issue.20 , pp. 2196
    • Frabboni, S.1    Matteucci, G.2    Pozzi, G.3
  • 62
    • 0032620923 scopus 로고    scopus 로고
    • Two-dimensional mapping of the electrostatic potential in transistors by electron holography
    • Rau W-D, Schwander P, Baumann F H, Höppner W and Ourmazd A 1999 Two-dimensional mapping of the electrostatic potential in transistors by electron holography Phys. Rev. Lett. 82 2614
    • (1999) Phys. Rev. Lett. , vol.82 , Issue.12 , pp. 2614
    • Rau, W.-D.1    Schwander, P.2    Baumann, F.H.3    Höppner, W.4    Ourmazd, A.5
  • 64
    • 0037054193 scopus 로고    scopus 로고
    • Quantitative electron holography of biased semiconductor devices
    • Twitchett A C, Dunin-Borkowski R E and Midgley P A 2002 Quantitative electron holography of biased semiconductor devices Phys. Rev. Lett. 88 238302
    • (2002) Phys. Rev. Lett. , vol.88 , Issue.23 , pp. 238302
    • Twitchett, A.C.1    Dunin-Borkowski, R.E.2    Midgley, P.A.3
  • 65
    • 27944448896 scopus 로고    scopus 로고
    • 2D-mapping of dopant distribution in deep sub micron CMOS devices by electron holography using adapted FIB-preparation
    • Lenk A, Lichte H and Muehle U 2005 2D-mapping of dopant distribution in deep sub micron CMOS devices by electron holography using adapted FIB-preparation J. Electron Microsc. 54 351-9
    • (2005) J. Electron Microsc. , vol.54 , Issue.4 , pp. 351-359
    • Lenk, A.1    Lichte, H.2    Muehle, U.3
  • 66
    • 24144454670 scopus 로고    scopus 로고
    • Characterisation of dopants distribution using electron holography and FIB-based lift-off preparation
    • Muehle U, Lenk A, Weiland R and Lichte H 2005 Characterisation of dopants distribution using electron holography and FIB-based lift-off preparation Microelectron. Reliab. 45 1558-61
    • (2005) Microelectron. Reliab. , vol.45 , Issue.9-11 , pp. 1558-1561
    • Muehle, U.1    Lenk, A.2    Weiland, R.3    Lichte, H.4
  • 67
    • 0035725598 scopus 로고    scopus 로고
    • Examination of electrostatic potential distribution across an implanted p-n junction by electron holography
    • Wang Z, Sasaki K, Kato N, Urata K, Hirayama T and Saka H 2001 Examination of electrostatic potential distribution across an implanted p-n junction by electron holography J. Electron Microsc. 50 479-84
    • (2001) J. Electron Microsc. , vol.50 , Issue.6 , pp. 479-484
    • Wang, Z.1    Sasaki, K.2    Kato, N.3    Urata, K.4    Hirayama, T.5    Saka, H.6
  • 68
    • 36049032437 scopus 로고    scopus 로고
    • Potential and limitations of electron holography in silicon research
    • Formanek P and Kittler M 2005 Potential and limitations of electron holography in silicon research Solid State Phenom. 108-09 603-8
    • (2005) Solid State Phenom. , vol.108 , Issue.9 , pp. 603-608
    • Formanek, P.1    Kittler, M.2
  • 69
    • 0037054193 scopus 로고    scopus 로고
    • Quantitative electron holography of biased semiconductor devices
    • Twitchett A C, Dunin-Borkowski R E and Midgley P A 2002 Quantitative electron holography of biased semiconductor devices Phys. Rev. Lett. 88 238302
    • (2002) Phys. Rev. Lett. , vol.88 , Issue.23 , pp. 238302
    • Twitchett, A.C.1    Dunin-Borkowski, R.E.2    Midgley, P.A.3
  • 71
    • 0011542789 scopus 로고
    • Electron optical studies of barium titanate single crystal films
    • Tanaka M, Kitamura N and Honjo G 1962 Electron optical studies of barium titanate single crystal films J. Phys. Soc. Japan 17 1197
    • (1962) J. Phys. Soc. Japan , vol.17 , Issue.7 , pp. 1197
    • Tanaka, M.1    Kitamura, N.2    Honjo, G.3
  • 72
    • 0000513812 scopus 로고
    • Electron holographic study of ferroelectric domain walls
    • Zhang X, Hashimoto T and Joy D C 1992 Electron holographic study of ferroelectric domain walls Appl. Phys. Lett. 60 784
    • (1992) Appl. Phys. Lett. , vol.60 , Issue.6 , pp. 784
    • Zhang, X.1    Hashimoto, T.2    Joy, D.C.3
  • 73
    • 0033712426 scopus 로고    scopus 로고
    • Are ferroelectric crystals blaze-gratings for electrons?
    • Lichte H 2000 Are ferroelectric crystals blaze-gratings for electrons? Cryst. Res. Technol. 35 887-98
    • (2000) Cryst. Res. Technol. , vol.35 , Issue.6-7 , pp. 887-898
    • Lichte, H.1
  • 75
    • 0026911058 scopus 로고
    • Electron holography in the study of electrostatic fields: The case of charged microtips
    • Matteucci G, Missirolli G F, Muccini M and Pozzi G 1992 Electron holography in the study of electrostatic fields: the case of charged microtips Ultramicroscopy 45 77-83
    • (1992) Ultramicroscopy , vol.45 , Issue.1 , pp. 77-83
    • Matteucci, G.1    Missirolli, G.F.2    Muccini, M.3    Pozzi, G.4
  • 77
    • 3943096494 scopus 로고
    • Direct observation of fine structure of magnetic domain walls by electron holography
    • Tonomura A, Matsuda T, Endo J, Arii T and Mihama K 1980 Direct observation of fine structure of magnetic domain walls by electron holography Phys. Rev. Lett. 44 1430-3
    • (1980) Phys. Rev. Lett. , vol.44 , Issue.21 , pp. 1430-1433
    • Tonomura, A.1    Matsuda, T.2    Endo, J.3    Arii, T.4    Mihama, K.5
  • 78
    • 18244380580 scopus 로고    scopus 로고
    • True single domain and configuration-assisted switching of submicron permalloy dots observed by electron holography
    • Heumann M, Uhlig T and Zweck J 2005 True single domain and configuration-assisted switching of submicron permalloy dots observed by electron holography Phys. Rev. Lett. 94 077202
    • (2005) Phys. Rev. Lett. , vol.94 , Issue.7 , pp. 077202
    • Heumann, M.1    Uhlig, T.2    Zweck, J.3
  • 82
    • 18144376271 scopus 로고    scopus 로고
    • TEM-characterization of magnetic samarium- and cobalt-rich-nanocrystals formed in hexagonal SiC
    • Biskupek J, Kaiser U, Lichte H, Lenk A, Gemming Th, Pasold G and Witthuhn W 2005 TEM-characterization of magnetic samarium- and cobalt-rich-nanocrystals formed in hexagonal SiC J. Magn. Magn. Mater. 293 924
    • (2005) J. Magn. Magn. Mater. , vol.293 , Issue.3 , pp. 924
    • Biskupek, J.1    Kaiser, U.2    Lichte, H.3    Lenk, A.4    Th, G.5    Pasold, G.6    Witthuhn, W.7
  • 85
    • 0023162961 scopus 로고
    • EMS-a software package for electron diffraction analysis and HREM image simulation in materials science
    • Stadelmann P A 1987 EMS-a software package for electron diffraction analysis and HREM image simulation in materials science Ultramicroscopy 21 131
    • (1987) Ultramicroscopy , vol.21 , Issue.2 , pp. 131
    • Stadelmann, P.A.1
  • 86
    • 0027109810 scopus 로고
    • Resolution in high-resolution electron microscopy
    • O'Keefe M A 1992 Resolution in high-resolution electron microscopy Ultramicroscopy 47 282-97
    • (1992) Ultramicroscopy , vol.47 , Issue.1-3 , pp. 282-297
    • O'Keefe, M.A.1
  • 87
    • 0027619479 scopus 로고
    • Parameters for high-resolution electron holography
    • Lichte H 1993 Parameters for high-resolution electron holography Ultramicroscopy 51 15-20
    • (1993) Ultramicroscopy , vol.51 , Issue.1-4 , pp. 15-20
    • Lichte, H.1
  • 88
    • 0012403631 scopus 로고
    • Numerical reconstruction of the electron object wave from an electron hologram including the correction of aberrations
    • Franke F J, Herrmann K-H and Lichte H 1988 Numerical reconstruction of the electron object wave from an electron hologram including the correction of aberrations Scanning Microsc. 2 (Suppl.) 59-67
    • (1988) Scanning Microsc. , vol.2 , Issue.SUPPL. , pp. 59-67
    • Franke, F.J.1    Herrmann, K.-H.2    Lichte, H.3
  • 89
    • 0002110722 scopus 로고
    • Electron image plane off-axis holography of atomic structures
    • Lichte H 1991 Electron image plane off-axis holography of atomic structures Adv. Opt. Electron. Microsc. 12 25-91
    • (1991) Adv. Opt. Electron. Microsc. , vol.12 , pp. 25-91
    • Lichte, H.1
  • 90
    • 0000974029 scopus 로고
    • Correction of aberration of an electron microscope by means of electron holography
    • Fu Q, Lichte H and Völkl E 1991 Correction of aberration of an electron microscope by means of electron holography Phys. Rev. Lett. 67 2319-22
    • (1991) Phys. Rev. Lett. , vol.67 , Issue.17 , pp. 2319-2322
    • Fu, Q.1    Lichte, H.2    Völkl, E.3
  • 91
    • 0034333411 scopus 로고    scopus 로고
    • Determination and correction of the coherent wave aberration from a single off-axis electron hologram by means of a genetic algorithm
    • Lehmann M 2000 Determination and correction of the coherent wave aberration from a single off-axis electron hologram by means of a genetic algorithm Ultramicroscopy 85 165-82
    • (2000) Ultramicroscopy , vol.85 , Issue.3 , pp. 165-182
    • Lehmann, M.1
  • 93
    • 0027109838 scopus 로고
    • Electron holography: I. Can electron holography reach 0.1 nm resolution?
    • Lichte H 1992 Electron holography: I. Can electron holography reach 0.1 nm resolution? Ultramicroscopy 47 223
    • (1992) Ultramicroscopy , vol.47 , Issue.1-3 , pp. 223
    • Lichte, H.1
  • 94
    • 0028417386 scopus 로고
    • Aberration correction using off-axis holography: I. Aberration assessment
    • Ishizuka K, Tanji T, Tonomura A, Ohno T and Murayama Y 1994 Aberration correction using off-axis holography: I. Aberration assessment Ultramicroscopy 53 361-70
    • (1994) Ultramicroscopy , vol.53 , Issue.4 , pp. 361-370
    • Ishizuka, K.1    Tanji, T.2    Tonomura, A.3    Ohno, T.4    Murayama, Y.5
  • 96
    • 3042639959 scopus 로고    scopus 로고
    • Influence of the elliptical illumination on acquisition and correction of coherent aberrations in high-resolution electron holography
    • Lehmann M 2004 Influence of the elliptical illumination on acquisition and correction of coherent aberrations in high-resolution electron holography Ultramicroscopy 100 9-23
    • (2004) Ultramicroscopy , vol.100 , Issue.1-2 , pp. 9-23
    • Lehmann, M.1
  • 97
    • 25444502070 scopus 로고    scopus 로고
    • Electron holographic material analysis at atomic dimensions
    • Lehmann M and Lichte H 2005 Electron holographic material analysis at atomic dimensions Cryst. Res. Technol. 40 149-60
    • (2005) Cryst. Res. Technol. , vol.40 , Issue.1-2 , pp. 149-160
    • Lehmann, M.1    Lichte, H.2
  • 99
    • 0001253323 scopus 로고
    • Computation of absorptive form factors for high-energy electron diffraction
    • Weickenmeier A and Kohl H 1991 Computation of absorptive form factors for high-energy electron diffraction Acta Cryst. A 47 590
    • (1991) Acta Cryst. , vol.47 , Issue.5 , pp. 590
    • Weickenmeier, A.1    Kohl, H.2
  • 101
    • 41849110982 scopus 로고    scopus 로고
    • The statistics of the thermal motion of the atoms during imaging process in transmission electron microscopy and related techniques
    • Rother A, Gemming Th and Lichte H The statistics of the thermal motion of the atoms during imaging process in transmission electron microscopy and related techniques Ultramicroscopy submitted
    • Ultramicroscopy
    • Rother, A.1    Th, G.2    Lichte, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.