Image properties in an aberration-corrected photoemission electron microscope

Physics Procedia

Volumn 1, Issue 1, 2008, Pages 505-511

  Konenkamp R ^a   Jones, T ^a   Elstner, J ^a   Word, R ^a   Rempfer, G ^a   Dixon, T ^a   Almaraz, L ^a   Skoczylas, W ^b  

^a PORTLAND STATE UNIVERSITY   (United States)

^b Thermo Fisher Scientific   (United States)

Author keywords

Aberration correction; Electron microscopy; Photoemission

Indexed keywords

EID: 54149114394     PISSN: 18753884     EISSN: 18753892     Source Type: Conference Proceeding    
DOI: 10.1016/j.phpro.2008.07.132     Document Type: Conference Paper

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