Scanning electron microscopy: Second best no more

Nature Materials

Volumn 8, Issue 10, 2009, Pages 776-777

  Joy, David C ^a,b  

^a University of Tennessee Knoxville   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 70349331670     PISSN: 14761122     EISSN: 14764660     Source Type: Journal    
DOI: 10.1038/nmat2538     Document Type: Note

References (5)

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2. Salow, H. Phys. Z. 41,434-436 ( 1940).
3. Bethe, H. Phys. Rev. 59, 940-941 (1941).
4. Pennycook, S. J. & Howie, A. Phil. Mag. Lett. 41, 809-827(1980).
5. Spencer, J. P., Humphreys, C. J. & Hirsch, P. B. Phil. Mag. Lett. 26, 193-213(1972).