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Volumn 321, Issue 5887, 2008, Pages 379-382

High-resolution scanning X-ray diffraction microscopy

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING METHOD; MICROSCOPY; SCANNING ELECTRON MICROSCOPY; X-RAY DIFFRACTION;

EID: 47749095385     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1158573     Document Type: Article
Times cited : (1199)

References (33)
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    • I. McNulty et al., Science 256, 1009 (1992).
    • (1992) Science , vol.256 , pp. 1009
    • McNulty, I.1
  • 8
    • 11144322219 scopus 로고    scopus 로고
    • S. Eisebitt et al., Nature 432, 885 (2004).
    • (2004) Nature , vol.432 , pp. 885
    • Eisebitt, S.1
  • 18
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    • Materials and methods are available as supporting material on Science Online.
    • Materials and methods are available as supporting material on Science Online.
  • 19
    • 47749155448 scopus 로고    scopus 로고
    • The validity of this relation, discussed in (18), depends on the thickness of the specimen, on the probe's depth of focus, and on the resolution of the reconstruction.
    • The validity of this relation, discussed in (18), depends on the thickness of the specimen, on the probe's depth of focus, and on the resolution of the reconstruction.
  • 20
    • 47749116269 scopus 로고    scopus 로고
    • Measurements were carried at the coherent small-angle x-ray scattering (cSAXS) beamline of the Swiss Light Source at Paul Scherrer Institut
    • Measurements were carried at the coherent small-angle x-ray scattering (cSAXS) beamline of the Swiss Light Source at Paul Scherrer Institut.
  • 21
    • 47749099882 scopus 로고    scopus 로고
    • At each point rj of the raster grid, assuming that O varies slowly within the illuminated region, the measured diffraction pattern can be approximated with Ij(q) ≈ |O(rj, 2|P̃[q, ∇φ(rj, 2; where P̃ is the Fourier transform of P. The specimen's transmission, O(rj)|2, is read from the overall attenuation of the signal, and the phase gradient, ∇φr j, is seen as a position shift of the diffraction pattern on the detector
    • j), is seen as a position shift of the diffraction pattern on the detector.
  • 26
    • 47749146723 scopus 로고    scopus 로고
    • In the Fraunhoffer regime, the wave in the transverse plane at the exit of the specimen ψ(r) is related to the intensity measurement by I(q, ψ(q)|2; where ψ(q) is the 2D Fourier transform of ψ(r, This equality constrains the amplitude of ψ(q) but not its phase
    • 2; where ψ(q) is the 2D Fourier transform of ψ(r). This equality constrains the amplitude of ψ(q) but not its phase.
  • 27
    • 47749126770 scopus 로고    scopus 로고
    • 2, ...) are the solution of the coupled system (Equation Presented). More details on the algorithm are provided in (18).
    • 2, ...) are the solution of the coupled system (Equation Presented). More details on the algorithm are provided in (18).
  • 33
    • 47749140225 scopus 로고    scopus 로고
    • We wish to thank P. Kraft, E. F. Eikenberry, B. Henrich, and C. Brönnimann for the Pilatus detector commissioning and the ongoing support; K. Jefimovs for the fabrication of nanostructures; K. Nygard for producing the scanning electron microscopy (SEM) picture of the specimen; X. Donath for the technical support at the cSAXS beamline; and J. Rodenburg for introducing us to ptychography. This work was performed at the Swiss Light Source, Paul Scherrer Institut, Villigen, Switzerland. P.T. acknowledges financial support from the Fonds Québécois de la recherche sur la nature et les technologies FQRNT
    • We wish to thank P. Kraft, E. F. Eikenberry, B. Henrich, and C. Brönnimann for the Pilatus detector commissioning and the ongoing support; K. Jefimovs for the fabrication of nanostructures; K. Nygard for producing the scanning electron microscopy (SEM) picture of the specimen; X. Donath for the technical support at the cSAXS beamline; and J. Rodenburg for introducing us to ptychography. This work was performed at the Swiss Light Source, Paul Scherrer Institut, Villigen, Switzerland. P.T. acknowledges financial support from the Fonds Québécois de la recherche sur la nature et les technologies (FQRNT).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.