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47749119390
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Materials and methods are available as supporting material on Science Online.
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Materials and methods are available as supporting material on Science Online.
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19
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47749155448
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The validity of this relation, discussed in (18), depends on the thickness of the specimen, on the probe's depth of focus, and on the resolution of the reconstruction.
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The validity of this relation, discussed in (18), depends on the thickness of the specimen, on the probe's depth of focus, and on the resolution of the reconstruction.
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20
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47749116269
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Measurements were carried at the coherent small-angle x-ray scattering (cSAXS) beamline of the Swiss Light Source at Paul Scherrer Institut
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Measurements were carried at the coherent small-angle x-ray scattering (cSAXS) beamline of the Swiss Light Source at Paul Scherrer Institut.
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21
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47749099882
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At each point rj of the raster grid, assuming that O varies slowly within the illuminated region, the measured diffraction pattern can be approximated with Ij(q) ≈ |O(rj, 2|P̃[q, ∇φ(rj, 2; where P̃ is the Fourier transform of P. The specimen's transmission, O(rj)|2, is read from the overall attenuation of the signal, and the phase gradient, ∇φr j, is seen as a position shift of the diffraction pattern on the detector
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j), is seen as a position shift of the diffraction pattern on the detector.
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26
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47749146723
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In the Fraunhoffer regime, the wave in the transverse plane at the exit of the specimen ψ(r) is related to the intensity measurement by I(q, ψ(q)|2; where ψ(q) is the 2D Fourier transform of ψ(r, This equality constrains the amplitude of ψ(q) but not its phase
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2; where ψ(q) is the 2D Fourier transform of ψ(r). This equality constrains the amplitude of ψ(q) but not its phase.
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27
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47749126770
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2, ...) are the solution of the coupled system (Equation Presented). More details on the algorithm are provided in (18).
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2, ...) are the solution of the coupled system (Equation Presented). More details on the algorithm are provided in (18).
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28
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33646690297
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H. M. Quiney, A. G. Peele, Z. Cai, D. Paterson, K. A. Nugent, Nat. Phys. 2, 101 (2006).
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Peele, A.G.2
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Nugent, K.A.5
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47749140225
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We wish to thank P. Kraft, E. F. Eikenberry, B. Henrich, and C. Brönnimann for the Pilatus detector commissioning and the ongoing support; K. Jefimovs for the fabrication of nanostructures; K. Nygard for producing the scanning electron microscopy (SEM) picture of the specimen; X. Donath for the technical support at the cSAXS beamline; and J. Rodenburg for introducing us to ptychography. This work was performed at the Swiss Light Source, Paul Scherrer Institut, Villigen, Switzerland. P.T. acknowledges financial support from the Fonds Québécois de la recherche sur la nature et les technologies FQRNT
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We wish to thank P. Kraft, E. F. Eikenberry, B. Henrich, and C. Brönnimann for the Pilatus detector commissioning and the ongoing support; K. Jefimovs for the fabrication of nanostructures; K. Nygard for producing the scanning electron microscopy (SEM) picture of the specimen; X. Donath for the technical support at the cSAXS beamline; and J. Rodenburg for introducing us to ptychography. This work was performed at the Swiss Light Source, Paul Scherrer Institut, Villigen, Switzerland. P.T. acknowledges financial support from the Fonds Québécois de la recherche sur la nature et les technologies (FQRNT).
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