Measuring the Young's modulus of solid nanowires by in situ TEM

Journal of Electron Microscopy

Volumn 51, Issue SUPPL., 2002, Pages

  Wang, Z L ^a   Dai, Z R ^a   Gao, R ^a   Gole, J L ^b  

^a Georgia Institute of Technology   (United States)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

In situ TEM; Nanotube; Nanowire; Young's modulus

Indexed keywords

ELASTIC MODULI; ELECTRIC FIELDS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOTUBES; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; SILICA;

ATOMIC SCALE; DIRECT MEASUREMENT; ELECTRIC FIELD INDUCED; IN-SITU TRANSMISSION ELECTRON MICROSCOPIES; MEASUREMENTS OF; MECHANICAL RESONANCE; PROPERTY; PROPERTY MEASUREMENT; SCANNING-PROBE MICROSCOPY; YOUNG-S MODULUS;

NANOWIRES;

EID: 0036296596     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/51.supplement.s79     Document Type: Conference Paper

References (18)

1. Nanobeam mechanics: Elasticity, strength, and toughness of nanorods and nanotubes
2. Elastic and shear moduli of single-walled carbon nanotube ropes
3. Exceptionally high Young's modulus observed for individual carbon nanotubes
4. Electrostatic deflections and electromechanical resonances of carbon nanotubes
5. Nanomeasurements of individual carbon nanotubes by in situ TEM
6. Nanomechanics of individual carbon nanotubes from pyrolytically grown arrays
7. Semiconductor nanowires from oxides
8. Direct synthesis of silicon nanowires, silica nanospheres, and wire-like nanosphere agglomerates
9. Side-by-side silicon carbide-silica biaxial nanowires: Synthesis, structure and mechanical properties
10. Are multiwalled carbon nanotubes ballistic conductors?
11. Carbon nanotube quantum resistors
12. Work function at the tips of multi-walled carbon nanotubes
13. Nanomeasurements in transmission electron microscopy
14. Nanobelts of semiconducting oxides