SCOPUS 정보 검색 플랫폼

Volumn 104, Issue 20, 2010, Pages

Nanoscale energy-filtered scanning confocal electron microscopy using a double-aberration-corrected transmission electron microscope

(8) Wang, Peng a Behan, Gavin a Takeguchi, Masaki b Hashimoto, Ayako b Mitsuishi, Kazutaka b Shimojo, Masayuki c Kirkland, Angus I a Nellist, Peter D a

a UNIVERSITY OF OXFORD (United Kingdom)

b NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

c SAITAMA INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

A-CARBON; ABERRATION CORRECTORS; CHEMICAL MAPPING; CHROMATIC ABERRATION; DEPTH RESOLUTION; ENERGY FILTERING; NANO SCALE; RESPONSE FUNCTIONS; TRANSMISSION ELECTRON MICROSCOPE;

ABERRATIONS; CARBON FILMS; ELECTRON MICROSCOPES; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRONS;

EID: 77953104571 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.104.200801 Document Type: Article

Times cited : (48)

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