Chapter 9 Materials Applications of Aberration-Corrected Scanning Transmission Electron Microscopy

Advances in Imaging and Electron Physics

Volumn 153, Issue , 2008, Pages 327-384

  Pennycook, S J ^a,b   Chisholm, M F ^a   Lupini, A R ^a   Varela, M ^a   van Benthem, K ^a   Borisevich, A Y ^a   Oxley, M P ^a,b   Luo, W ^a,b   Pantelides, S T ^a,b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b VANDERBILT UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ABERRATION CORRECTORS; ABERRATION-CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPIES; DEPTH SENSITIVITY; IMAGE INTENSITIES; INFORMATION TRANSFERS; OAK RIDGE NATIONAL LABORATORIES; SCANNING TRANSMISSION ELECTRON MICROSCOPES; THREE DIMENSIONS;

SCANNING ELECTRON MICROSCOPY;

EID: 67649444052     PISSN: 10765670     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S1076-5670(08)01009-4     Document Type: Chapter

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