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Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences

Volumn 367, Issue 1903, 2009, Pages 3699-3707

Chromatic correction: A revolution in electron microscopy?

(1) Zach, J a

a CEOS GmbH (Germany)

Author keywords

Atomic resolution; Chromatic correction; Electron microscope design

Indexed keywords

ELECTRON BEAMS; ELECTRON MICROSCOPES; ELECTRONS; FIELD EMISSION; OPTICAL INSTRUMENT LENSES; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC RESOLUTION; CHROMATIC ABERRATION; CHROMATIC CORRECTION; FAR-FIELD; FIELD EMISSION GUNS; FOCAL LENGTHS; HIGH ACCELERATION; HIGH-RESOLUTION TEM; MICROSCOPE DESIGN; NM RESOLUTION; OBJECTIVE LENS; SCANNING ELECTRON MICROSCOPE; TECHNICAL DEVELOPMENT; TEM; TRANSMISSION ELECTRON MICROSCOPE; VERY LOW VOLTAGE;

ELECTRON GUNS;

EID: 70349421052 PISSN: 1364503X EISSN: None Source Type: Journal
DOI: 10.1098/rsta.2009.0125 Document Type: Article

Times cited : (19)

References (9)

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