Off-axis electron holography in an aberration-corrected transmission electron microscope

Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences

Volumn 367, Issue 1903, 2009, Pages 3773-3793

  Lichte, Hannes ^a   Geiger, Dorin ^a   Linck, Martin ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Aberration correction; Atomic resolution; Electron holography; Noise problems; Signal resolution; Transmission electron microscopy

Indexed keywords

ABERRATIONS; ACOUSTIC INTENSITY; CESIUM; ELECTRON HOLOGRAPHY; ELECTRON MICROSCOPES; HOLOGRAPHIC INTERFEROMETRY; SEMICONDUCTOR QUANTUM WIRES; SIGNAL TO NOISE RATIO; TRANSMISSION ELECTRON MICROSCOPY;

ABERRATION CORRECTION; ATOMIC DIMENSION; ATOMIC RESOLUTION; COLLECTION EFFICIENCY; ELECTRON CURRENTS; ELECTRON WAVE; FINE STRUCTURES; IMAGE PLANE; NOISE PROBLEMS; OFF-AXIS ELECTRON HOLOGRAPHY; POINT-SPREAD FUNCTION; QUANTITATIVE EVALUATION; SIGNAL RESOLUTION; TEM; TRANSMISSION ELECTRON MICROSCOPE;

ELECTRONS;

EID: 70349428557     PISSN: 1364503X     EISSN: None     Source Type: Journal    
DOI: 10.1098/rsta.2009.0126     Document Type: Article

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