A new separator design for aberration corrected photoemission electron microscopes

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 564, Issue 1, 2006, Pages 537-543

  Wan, W ^a   Feng, J ^a   Padmore, H A ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Aberration correction; Beam separator; Differential algebra; XPEEM

Indexed keywords

ABERRATIONS; COMPUTER SIMULATION; ELECTRON LENSES; MAGNETIC DEVICES; MIRRORS; OPTICAL PROPERTIES; PHOTOEMISSION; POWER ELECTRONICS;

ABERRATION CORRECTION; BEAM SEPARATOR; DIFFERENTIAL ALGEBRA;

ELECTRON MICROSCOPES;

EID: 33745917986     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2006.03.024     Document Type: Article

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