Energy-filtered transmission electron microscopy based on inner-shell ionization

Ultramicroscopy

Volumn 110, Issue 8, 2010, Pages 981-990

  Lugg, N R ^a   Freitag, B ^b   Findlay, S D ^c   Allen, L J ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b Thermo Fisher Scientific   (United States)

^c UNIVERSITY OF TOKYO   (Japan)

Author keywords

Energy filtered transmission electron microscopy (EFTEM); Inner shell ionization

Indexed keywords

ADJACENT SITES; ATOMIC RESOLUTION; ELASTIC CONTRAST; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; EXPERIMENTAL DATA; FIRST-PRINCIPLES APPROACHES; IMAGE FEATURES; INNER-SHELL IONIZATION; LONG TAIL; TEST SPECIMENS; THRESHOLD ENERGY;

ELECTRONS; LANTHANUM; LANTHANUM ALLOYS; PARTICLE DETECTORS; SCANNING ELECTRON MICROSCOPY; SHELLS (STRUCTURES); TRANSMISSION ELECTRON MICROSCOPY;

IONIZATION;

LANTHANUM;

ARTICLE; ATOM; CALCULATION; CONTROLLED STUDY; ELASTICITY; ELECTRIC POTENTIAL; ENERGY; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; IMAGE ANALYSIS; IMAGE DISPLAY; INNER SHELL IONIZATION; IONIZATION; LIGHT SCATTERING; PHASE TRANSITION; WAVEFORM;

EID: 77955514246     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.11.019     Document Type: Article

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