Simulation of a mirror corrector for PEEM3

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 519, Issue 1-2, 2004, Pages 222-229

  Wan, W ^a   Feng, J ^a   Padmore, H A ^a   Robin, D S ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Aberration correction; Differential algebra; Electron mirror; XPEEM

Indexed keywords

ABERRATIONS; ALGEBRA; COMPUTER SIMULATION; ELECTRODES; ELECTRON BEAMS; FINITE ELEMENT METHOD; PHOTOEMISSIVE DEVICES; RAY TRACING; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ABERRATION CORRECTION; DIFFERENTIAL ALGEBRA; ELECTRON MIRROR; X-RAY EXCITED PHOTOEMISSION ELECTRON MICROSCOPE (XPEEM); XPEEM;

ELECTRON OPTICS;

EID: 1042292723     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2003.11.159     Document Type: Conference Paper

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