Gentle STEM: ADF imaging and EELS at low primary energies

Ultramicroscopy

Volumn 110, Issue 8, 2010, Pages 935-945

  Krivanek, Ondrej L ^a   Dellby, Niklas ^a   Murfitt, Matthew F ^a   Chisholm, Matthew F ^b   Pennycook, Timothy J ^b   Suenaga, Kazutomo ^c   Nicolosi, Valeria ^d  

^a Nion Co Kirkland   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^d UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Aberration correction; ADF; EELS; Graphene; Nanotube; STEM

Indexed keywords

ABERRATION CORRECTION; ADF; ATOMIC MOTION; CHEMICAL IDENTIFICATION; DARK FIELD; ELECTRON DOSE; ELEMENTAL ANALYSIS; HEAVY ATOMS; IMPURITY ATOMS; LIGHT ATOMS; PRIMARY ENERGIES; PROBE SIZE; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SINGLE ATOMS; Z-DEPENDENCE;

ABERRATIONS; ATOMS; ENERGY DISSIPATION; ERBIUM; GRAPHENE; GRAPHITE; NANOTUBES; RADIATION DAMAGE; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

BORON; CARBON; GRAPHENE; NANOTUBE; NITROGEN; OXYGEN;

ANNULAR DARK FIELD IMAGING; ARTICLE; ATOM; ELECTRIC POTENTIAL; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON RADIATION; ENERGY; FIELD EMISSION; IMAGING SYSTEM; LOW ENERGY RADIATION; MATHEMATICAL ANALYSIS; RADIATION DOSE; RADIATION INJURY; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIGNAL NOISE RATIO;

EID: 77955512957     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.02.007     Document Type: Article

References (34)

1. Crewe A.V., Wall J., Welter L.M. J. Appl. Phys. 1968, 39:5861.
2. Crewe A.V., Wall J. J. Mol. Biol. 1970, 48:375.
3. Crewe A.V., Wall J., Langmore J. Science 1970, 168:1338.
4. Isaacson M., Johnson D. Ultramicroscopy 1975, 1:33.
5. Crewe A.V. Microsc. Microanal. 2004, 10:414.
6. Crewe A.V. Cold field emission and the scanning transmission electron microscope. Advances in Imaging & Electron Physics 2009, vol. 159:1. Elsevier, Amsterdam.
7. Wardell I.M.R., Bovey P.E. Cold field emission and the scanning transmission electron microscope. Advances in Imaging & Electron Physics 2009, vol. 159:221. Elsevier, Amsterdam.
8. von Harrach H.S. Cold field emission and the scanning transmission electron microscope. Advances in Imaging & Electron Physics 2009, vol. 159:287. Elsevier, Amsterdam.
9. Inada H., et al. Cold field emission and the scanning transmission electron microscope. Advances in Imaging & Electron Physics 2009, vol. 159:123. Elsevier, Amsterdam.
10. Browning N.D., Chisholm M.F., Pennycook S.J. Nature 1993, 366:143.
11. Muller D.A., Tzou Y., Raj R., Silcox J. Nature 1993, 366:725.
12. Batson P.E. Nature 1993, 366:727.
13. Meyer J.C., Chuvilin A., Algara-Siller G., Biskupek J., Kaiser U. Nano Lett. 2009, 9:2683.
14. Zobelli A., Gloter A., Ewels C.P., Seifert G., Colliex C. Phys. Rev. 2007, B75:245402.
15. Batson P.E., Dellby N., Krivanek O.L. Nature 2002, 418:617.
16. Batson P.E. Ultramicroscopy 2006, 106:1104.
17. Krivanek O.L., et al. Aberration-corrected electron microscopy. Advances in Imaging and Electron Physics 2008, vol. 153:121. Elsevier, Amsterdam.
18. O.L. Krivanek et al., Nature, in press, doi:10.1038/nature08879.
19. Krivanek O.L., et al. Ultramicroscopy 2008, 108:179.
20. Egerton R.F. EELS in the Electron Microscope 1996, Plenum Press, New York. 2nd Edn.
21. Egerton R.F. Ultramicroscopy 2007, 107:575.
22. Jeanguillaume C., Colliex C. Ultramicroscopy 1989, 78:252.
23. Suenaga K., et al. Nature Chemistry 2009, 1:415.
24. Hartel P., Rose H., Dignes C. Ultramicroscopy 1996, 63:93.
25. Suenaga K., et al. Nano Lett. 2003, 3:1395.
26. Urita K., et al. Nano Lett. 2004, 4:2451.
27. Rez P. Microsc. Microanal. 2001, 7:356.
28. Hernandez Y., et al. Nature Nanotechnol. 2008, 3:563.
29. Girit ÇO., et al. Science 2009, 323:1705.
30. R.F. Egerton, R. McLeod, F. Wang, M. Malac, this issue (2010).
31. Egerton R.F., Takeuchi M. Appl. Phys. Lett. 1999, 75:1884.
32. Bond G.M., Robertson I.M., Zeides F.M., Birnbaum H.K. Phil. Mag. 1987, A55:669.
33. Jolliffe I.T. Principal Component Analysis 2002, Springer, New York. 2nd Edn.
34. Cliff G., Lorimer G.W. J. Microsc. 1975, 103:203.