Imaging of radiation-sensitive samples in transmission electron microscopes equipped with Zernike phase plates

Ultramicroscopy

Volumn 108, Issue 2, 2008, Pages 126-140

  Malac, Marek ^a,c   Beleggia, Marco ^b   Egerton, Ray ^c   Zhu, Yimei ^b  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF ALBERTA   (Canada)

Author keywords

Biological TEM; Boersch lens; High resolution TEM; Low voltage TEM; Radiation damage; Single molecule TEM; Spherical aberration; Transmission electron microscope; Zernike phase plate

Indexed keywords

ABERRATIONS; GAUSSIAN BEAMS; IMAGE ANALYSIS; OPTIMIZATION; RADIATION DAMAGE; SIGNAL TO NOISE RATIO;

BIOLOGICAL TEM; BOERSCH LENS; LOW-VOLTAGE TEM; SPHERICAL ABERRATION; ZERNIKE PHASE PLATE;

TRANSMISSION ELECTRON MICROSCOPY;

IODINE;

ARTICLE; MATERIALS; RADIOSENSITIVITY; SIGNAL NOISE RATIO; SIMULATION; TRANSMISSION ELECTRON MICROSCOPY;

CARBON; IODINE; MICROSCOPY, ELECTRON, TRANSMISSION; MODELS, BIOLOGICAL; RADIATION TOLERANCE;

EID: 36749056913     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.03.008     Document Type: Article

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