Aberration-corrected scanning transmission electron microscopy: From atomic imaging and analysis to solving energy problems

Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences

Volumn 367, Issue 1903, 2009, Pages 3709-3733

  Pennycook, S J ^a,b   Chisholm, M F ^a   Lupini, A R ^a   Varela, M ^a   Borisevich, A Y ^a   Oxley, M P ^a,b   Luo, W D ^a,b   Benthem, K Van ^c   Oh, S H ^d   Sales, D L ^e   Molina, S I ^e   GarciA Barriocanal J ^f   Leon, C ^f   SantamariA J ^f   Rashkeev, S N ^g   Pantelides, S T ^a,b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b VANDERBILT UNIVERSITY   (United States)

^c University of California   (United States)

^d Korea Basic Science Institute (KBSI)   (South Korea)

^e UNIVERSITY OF CÁDIZ   (Spain)

^f UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

^g IDAHO NATIONAL LABORATORY   (United States)

Author keywords

Electron energy loss spectroscopy; Scanning transmission electron microscopy; Z contrast

Indexed keywords

ABERRATIONS; ATOMIC SPECTROSCOPY; CHEMICAL ELEMENTS; DISSOCIATION; ELECTRIC FIELD MEASUREMENT; ELECTRIC WIRE; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; NUCLEAR INSTRUMENTATION; PIXELS; PROBES; SCANNING; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR GROWTH; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC IMAGING; BRIGHT FIELDS; CATALYTIC ACTIVITY; DEPTH SENSITIVITY; ENERGY PROBLEM; LATERAL RESOLUTION; LIGHT ELEMENTS; LOW TEMPERATURES; NANO-PHASE; NUCLEATION AND GROWTH; OPTICAL SECTIONING; ORDERS OF MAGNITUDE; OXIDE SUPERLATTICES; PHASE-CONTRAST IMAGING; POSSIBLE FUTURES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SEMICONDUCTING NANOWIRES; SINGLE ATOMS; THREE DIMENSIONS; Z-CONTRAST; Z-CONTRAST IMAGES;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 70349421051     PISSN: 1364503X     EISSN: None     Source Type: Journal    
DOI: 10.1098/rsta.2009.0112     Document Type: Article

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