New developments in transmission electron microscopy for nanotechnology

Advanced Materials

Volumn 15, Issue 18, 2003, Pages 1497-1514

  Wang, Zhong Lin ^a  

^a Georgia Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CHARACTERIZATION; ELECTRIC VARIABLES MEASUREMENT; HOLOGRAPHY; LIGHT EMISSION; LITHIUM; MAGNETIC MATERIALS; MECHANICAL VARIABLES MEASUREMENT; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; OXYGEN; SCANNING ELECTRON MICROSCOPY;

ABBERATION FREE ANGSTROM RESOLUTION IMAGING; ENERGY LOSS SPECTROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IN SITU NANOSCALE PROPERTY MEASUREMENTS; LIGHT ELEMENTS; NANOMETER SCALE TECHNOLOGY; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 0141621235     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.200300384     Document Type: Review

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