-
1
-
-
0000072114
-
Optimum imaging parameters for elemental mapping in an energy filtering transmission electron microscope
-
Berger, A. and Kohl, H., 1993. Optimum imaging parameters for elemental mapping in an energy filtering transmission electron microscope. Optik, 92, 175-193.
-
(1993)
Optik
, vol.92
, pp. 175-193
-
-
Berger, A.1
Kohl, H.2
-
2
-
-
0007439947
-
Design of an analytical TEM with integrated imaging Ω-spectrometer
-
ed. G. W. Bailey. San Francisco Press, San Francisco
-
Bihr, J., Benner, G., Krahl, D., Rilk, A. and Weimer, E., 1991. Design of an analytical TEM with integrated imaging Ω-spectrometer. Proc. 49th Ann. Meet. Electron Microsc. Soc. Amer., ed. G. W. Bailey. San Francisco Press, San Francisco, pp. 354-355.
-
(1991)
Proc. 49th Ann. Meet. Electron Microsc. Soc. Amer.
, pp. 354-355
-
-
Bihr, J.1
Benner, G.2
Krahl, D.3
Rilk, A.4
Weimer, E.5
-
3
-
-
0002419039
-
Filtrage magnetique des vitesses en microscopie électronique
-
Castaing, R. and Henry, L., 1962. Filtrage magnetique des vitesses en microscopie électronique. Compt. Rend. Acad. Sci. Paris, B, 255, 76-78.
-
(1962)
Compt. Rend. Acad. Sci. Paris, B
, vol.255
, pp. 76-78
-
-
Castaing, R.1
Henry, L.2
-
4
-
-
84996171303
-
Images filtrées obtenues avex des électrons ayant subi des pertes d'énergie dues à l'excitation des niveaux profonds
-
Colliex, C. and Jouffrey, B., 1972. Images filtrées obtenues avex des électrons ayant subi des pertes d'énergie dues à l'excitation des niveaux profonds. Phil. Mag., 25, 491-514.
-
(1972)
Phil. Mag.
, vol.25
, pp. 491-514
-
-
Colliex, C.1
Jouffrey, B.2
-
5
-
-
0343810194
-
Quantitative aspects of scanning transmission electron microscopy
-
eds J. N. Chapman and A. J Craven. Scottish Universities Summer School in Physics, Edinburgh
-
Colliex, C. and Mory, C., 1983. Quantitative aspects of scanning transmission electron microscopy. In Quantitative Microscopy, eds J. N. Chapman and A. J Craven. Scottish Universities Summer School in Physics, Edinburgh, p. 191.
-
(1983)
Quantitative Microscopy
, pp. 191
-
-
Colliex, C.1
Mory, C.2
-
7
-
-
0029056771
-
Quantitative elemental mappings of materials by energy-filtered imaging
-
Crozier, P. A., 1995a. Quantitative elemental mappings of materials by energy-filtered imaging. Ultramicroscopy, 58, 157-174.
-
(1995)
Ultramicroscopy
, vol.58
, pp. 157-174
-
-
Crozier, P.A.1
-
8
-
-
0343810193
-
Practical limits on the spatial resolution in energy-filtered mapping
-
eds G. W. Bailey, M. H. Ellisman, R. A. Hennigar and N. J. Zaluzec. Jones & Begell, New York
-
Crozier, P. A., 1995b. Practical limits on the spatial resolution in energy-filtered mapping. 53rd Ann. Meet. Electron Microsc. Soc. Amer., eds G. W. Bailey, M. H. Ellisman, R. A. Hennigar and N. J. Zaluzec. Jones & Begell, New York, pp. 304-305.
-
(1995)
53rd Ann. Meet. Electron Microsc. Soc. Amer.
, pp. 304-305
-
-
Crozier, P.A.1
-
9
-
-
0029094087
-
Some practical consequences of the Lorentzian angular distribution of inelastic scattering
-
Egerton, R. F. and Wong, K., 1995. Some practical consequences of the Lorentzian angular distribution of inelastic scattering. Ultramicroscopy, 59, 169-180.
-
(1995)
Ultramicroscopy
, vol.59
, pp. 169-180
-
-
Egerton, R.F.1
Wong, K.2
-
11
-
-
8244227300
-
Microanalysis in the EM 902: Tests on a new TEM for ESI and EELS
-
eds G. W. Bailey and E. L. Hall. San Francisco Press, San Francisco
-
Egle, W., Rilk, A., Bihr, J. and Menzel, M., 1984. Microanalysis in the EM 902: Tests on a new TEM for ESI and EELS. Proc. 42nd Ann. Meet. Electron Microsc. Soc. Amer., eds G. W. Bailey and E. L. Hall. San Francisco Press, San Francisco, pp. 566-567.
-
(1984)
Proc. 42nd Ann. Meet. Electron Microsc. Soc. Amer.
, pp. 566-567
-
-
Egle, W.1
Rilk, A.2
Bihr, J.3
Menzel, M.4
-
12
-
-
0004175086
-
-
McGraw-Hill, New York
-
Jahnke, J., Emde, E. and Lösch, F., 1960. Tables of Higher Functions. McGraw-Hill, New York, p. 158.
-
(1960)
Tables of Higher Functions
, pp. 158
-
-
Jahnke, J.1
Emde, E.2
Lösch, F.3
-
13
-
-
0022221981
-
Theory of image formation by inelastically scattered electrons in the electron microscope
-
Kohl, H. and Rose, H., 1985. Theory of image formation by inelastically scattered electrons in the electron microscope. Adv. Electron. Electron Phys., 65, 175-200.
-
(1985)
Adv. Electron. Electron Phys.
, vol.65
, pp. 175-200
-
-
Kohl, H.1
Rose, H.2
-
14
-
-
0029155869
-
An imaging filter for biological applications
-
Krivanek, O. L., Friedman, S. L., Gubbens, A. J. and Kraus, B., 1995a. An imaging filter for biological applications. Ultramicroscopy, 59, 267-282.
-
(1995)
Ultramicroscopy
, vol.59
, pp. 267-282
-
-
Krivanek, O.L.1
Friedman, S.L.2
Gubbens, A.J.3
Kraus, B.4
-
15
-
-
0029619346
-
Spatial resolution in EFTEM maps
-
Krivanek, O. L., Kundman, M. K. and Kimoto, K., 1995b. Spatial resolution in EFTEM maps. J. Microscopy, 180, 277-287.
-
(1995)
J. Microscopy
, vol.180
, pp. 277-287
-
-
Krivanek, O.L.1
Kundman, M.K.2
Kimoto, K.3
-
16
-
-
0019084713
-
Diffraction de Fresnel des électrons diffusés élastiquement et inélastiquement par des ecrans semi-transparents
-
Peyre, H., Durai, P. and Henry, L., 1980. Diffraction de Fresnel des électrons diffusés élastiquement et inélastiquement par des ecrans semi-transparents. J. Physiques, 41, 1353-1360.
-
(1980)
J. Physiques
, vol.41
, pp. 1353-1360
-
-
Peyre, H.1
Durai, P.2
Henry, L.3
-
17
-
-
0003521686
-
-
Springer Series in Optical Sciences No. 36, 3rd edn. Springer-Verlag, Berlin
-
Reimer, L., 1993. Transmission Electron Microscopy, Springer Series in Optical Sciences No. 36, 3rd edn. Springer-Verlag, Berlin.
-
(1993)
Transmission Electron Microscopy
-
-
Reimer, L.1
-
19
-
-
0343810187
-
Validity of Lorentzian angular distribution in image formation with inelastically scattered electrons
-
Schenner, M., Schattschneider, P. and Egerton, R. F., 1995. Validity of Lorentzian angular distribution in image formation with inelastically scattered electrons. Micron, 26, 391-394.
-
(1995)
Micron
, vol.26
, pp. 391-394
-
-
Schenner, M.1
Schattschneider, P.2
Egerton, R.F.3
-
21
-
-
0011884990
-
Scanning transmission electron microscopy at high resolution
-
Wall, J., Langmore, J., Isaccson, M. and Crewe, A. V., 1974. Scanning transmission electron microscopy at high resolution. Proc. Nat. Acad Sci. USA. 71, 1-5.
-
(1974)
Proc. Nat. Acad Sci. USA
, vol.71
, pp. 1-5
-
-
Wall, J.1
Langmore, J.2
Isaccson, M.3
Crewe, A.V.4
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