메뉴 건너뛰기




Volumn 28, Issue 2, 1997, Pages 117-124

The effect of lens aberrations on the spatial resolution of an energy-filtered TEM image

Author keywords

EELS; Electron energy loss spectroscopy; Energy filtered images; Resolution

Indexed keywords


EID: 0030871738     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(97)00007-3     Document Type: Article
Times cited : (39)

References (21)
  • 1
    • 0000072114 scopus 로고
    • Optimum imaging parameters for elemental mapping in an energy filtering transmission electron microscope
    • Berger, A. and Kohl, H., 1993. Optimum imaging parameters for elemental mapping in an energy filtering transmission electron microscope. Optik, 92, 175-193.
    • (1993) Optik , vol.92 , pp. 175-193
    • Berger, A.1    Kohl, H.2
  • 2
    • 0007439947 scopus 로고
    • Design of an analytical TEM with integrated imaging Ω-spectrometer
    • ed. G. W. Bailey. San Francisco Press, San Francisco
    • Bihr, J., Benner, G., Krahl, D., Rilk, A. and Weimer, E., 1991. Design of an analytical TEM with integrated imaging Ω-spectrometer. Proc. 49th Ann. Meet. Electron Microsc. Soc. Amer., ed. G. W. Bailey. San Francisco Press, San Francisco, pp. 354-355.
    • (1991) Proc. 49th Ann. Meet. Electron Microsc. Soc. Amer. , pp. 354-355
    • Bihr, J.1    Benner, G.2    Krahl, D.3    Rilk, A.4    Weimer, E.5
  • 3
    • 0002419039 scopus 로고
    • Filtrage magnetique des vitesses en microscopie électronique
    • Castaing, R. and Henry, L., 1962. Filtrage magnetique des vitesses en microscopie électronique. Compt. Rend. Acad. Sci. Paris, B, 255, 76-78.
    • (1962) Compt. Rend. Acad. Sci. Paris, B , vol.255 , pp. 76-78
    • Castaing, R.1    Henry, L.2
  • 4
    • 84996171303 scopus 로고
    • Images filtrées obtenues avex des électrons ayant subi des pertes d'énergie dues à l'excitation des niveaux profonds
    • Colliex, C. and Jouffrey, B., 1972. Images filtrées obtenues avex des électrons ayant subi des pertes d'énergie dues à l'excitation des niveaux profonds. Phil. Mag., 25, 491-514.
    • (1972) Phil. Mag. , vol.25 , pp. 491-514
    • Colliex, C.1    Jouffrey, B.2
  • 5
    • 0343810194 scopus 로고
    • Quantitative aspects of scanning transmission electron microscopy
    • eds J. N. Chapman and A. J Craven. Scottish Universities Summer School in Physics, Edinburgh
    • Colliex, C. and Mory, C., 1983. Quantitative aspects of scanning transmission electron microscopy. In Quantitative Microscopy, eds J. N. Chapman and A. J Craven. Scottish Universities Summer School in Physics, Edinburgh, p. 191.
    • (1983) Quantitative Microscopy , pp. 191
    • Colliex, C.1    Mory, C.2
  • 7
    • 0029056771 scopus 로고
    • Quantitative elemental mappings of materials by energy-filtered imaging
    • Crozier, P. A., 1995a. Quantitative elemental mappings of materials by energy-filtered imaging. Ultramicroscopy, 58, 157-174.
    • (1995) Ultramicroscopy , vol.58 , pp. 157-174
    • Crozier, P.A.1
  • 8
    • 0343810193 scopus 로고
    • Practical limits on the spatial resolution in energy-filtered mapping
    • eds G. W. Bailey, M. H. Ellisman, R. A. Hennigar and N. J. Zaluzec. Jones & Begell, New York
    • Crozier, P. A., 1995b. Practical limits on the spatial resolution in energy-filtered mapping. 53rd Ann. Meet. Electron Microsc. Soc. Amer., eds G. W. Bailey, M. H. Ellisman, R. A. Hennigar and N. J. Zaluzec. Jones & Begell, New York, pp. 304-305.
    • (1995) 53rd Ann. Meet. Electron Microsc. Soc. Amer. , pp. 304-305
    • Crozier, P.A.1
  • 9
    • 0029094087 scopus 로고
    • Some practical consequences of the Lorentzian angular distribution of inelastic scattering
    • Egerton, R. F. and Wong, K., 1995. Some practical consequences of the Lorentzian angular distribution of inelastic scattering. Ultramicroscopy, 59, 169-180.
    • (1995) Ultramicroscopy , vol.59 , pp. 169-180
    • Egerton, R.F.1    Wong, K.2
  • 11
    • 8244227300 scopus 로고
    • Microanalysis in the EM 902: Tests on a new TEM for ESI and EELS
    • eds G. W. Bailey and E. L. Hall. San Francisco Press, San Francisco
    • Egle, W., Rilk, A., Bihr, J. and Menzel, M., 1984. Microanalysis in the EM 902: Tests on a new TEM for ESI and EELS. Proc. 42nd Ann. Meet. Electron Microsc. Soc. Amer., eds G. W. Bailey and E. L. Hall. San Francisco Press, San Francisco, pp. 566-567.
    • (1984) Proc. 42nd Ann. Meet. Electron Microsc. Soc. Amer. , pp. 566-567
    • Egle, W.1    Rilk, A.2    Bihr, J.3    Menzel, M.4
  • 13
    • 0022221981 scopus 로고
    • Theory of image formation by inelastically scattered electrons in the electron microscope
    • Kohl, H. and Rose, H., 1985. Theory of image formation by inelastically scattered electrons in the electron microscope. Adv. Electron. Electron Phys., 65, 175-200.
    • (1985) Adv. Electron. Electron Phys. , vol.65 , pp. 175-200
    • Kohl, H.1    Rose, H.2
  • 16
    • 0019084713 scopus 로고
    • Diffraction de Fresnel des électrons diffusés élastiquement et inélastiquement par des ecrans semi-transparents
    • Peyre, H., Durai, P. and Henry, L., 1980. Diffraction de Fresnel des électrons diffusés élastiquement et inélastiquement par des ecrans semi-transparents. J. Physiques, 41, 1353-1360.
    • (1980) J. Physiques , vol.41 , pp. 1353-1360
    • Peyre, H.1    Durai, P.2    Henry, L.3
  • 17
    • 0003521686 scopus 로고
    • Springer Series in Optical Sciences No. 36, 3rd edn. Springer-Verlag, Berlin
    • Reimer, L., 1993. Transmission Electron Microscopy, Springer Series in Optical Sciences No. 36, 3rd edn. Springer-Verlag, Berlin.
    • (1993) Transmission Electron Microscopy
    • Reimer, L.1
  • 19
    • 0343810187 scopus 로고
    • Validity of Lorentzian angular distribution in image formation with inelastically scattered electrons
    • Schenner, M., Schattschneider, P. and Egerton, R. F., 1995. Validity of Lorentzian angular distribution in image formation with inelastically scattered electrons. Micron, 26, 391-394.
    • (1995) Micron , vol.26 , pp. 391-394
    • Schenner, M.1    Schattschneider, P.2    Egerton, R.F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.