Atomic-scale electron microscopy at ambient pressure

Ultramicroscopy

Volumn 108, Issue 9, 2008, Pages 993-998

  Creemer, J F ^a   Helveg, S ^b   Hoveling, G H ^c   Ullmann, S ^b   Molenbroek, A M ^b   Sarro, P M ^a   Zandbergen, H W ^d  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b HALDOR TOPSØE A S   (Denmark)

^c DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^d DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Environmental TEM; ETEM; Gas solid interactions; MEMS; Methanol synthesis catalyst; Microelectromechanical systems; Nanocrystals

Indexed keywords

ATOMIC PHYSICS; ATOMS; COMPOSITE MICROMECHANICS; COPPER; ELECTROMECHANICAL DEVICES; HEATING; HYDROGEN; MEMS; METHANOL; MICROELECTROMECHANICAL DEVICES; NANOREACTORS; PRESSURE; SYNTHESIS GAS MANUFACTURE; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY;

AMBIENT PRESSURE (AP); ATOMIC RESOLUTIONS; CU ZNO CATALYSTS; DIRECT OBSERVATION; ELEVATED TEMPERATURES; ENVIRONMENTAL TRANSMISSION ELECTRON MICROSCOPY; FUNCTIONALIZED; GAS FLOWING; METHANOL SYNTHESIS; MICRO-ELECTRO- MECHANICAL SYSTEM (MEMS); NANO REACTORS; NANO-STRUCTURED; NANOCRYSTAL GROWTH; SAMPLE HOLDERS; SECOND TIME SCALE;

NANOSTRUCTURED MATERIALS;

COPPER; NANOCRYSTAL;

ARTICLE; ENERGY TRANSFER; GAS FLOW; IMAGE ANALYSIS; IMAGING SYSTEM; TEMPERATURE SENSITIVITY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 48149115689     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.04.014     Document Type: Article

References (30)

1. Butler E.P., and Hale K.F. Dynamic Experiments in the Electron Microscope, Practical Methods in Electron Microscopy vol. 9 (1981), North-Holland, Amsterdam
2. Baker R.T.K., and Harris P.S. J. Phys. E 5 (1972) 793
3. Boyes E.D., and Gai P.L. Ultramicroscopy 67 (1997) 219
4. Sharma R., and Crozier P.A. Environmental Transmission Electron Microscopy in Nanotechnology, Microscopy in Nanotechnology (2005), Kluwer Academic, New York
5. Hansen P.L., Helveg S., and Datye A.K. Adv. Catal. 50 (2006) 77
6. Parkinson G.M. Catal. Lett. 2 (1989) 303
7. Giorgio S., Sao Joao S., Nitsche S., Chaudanson D., Sitja G., and Henry C.R. Ultramicroscopy 106 (2006) 503
8. Daulton T.L., Little B.J., Kim J.W., Newell S., Lowe K., Furukawa Y., Jones-Meehan J., and Lavoie D.L. JEOL News 37E (2002) 6
9. Helveg S., López-Cartes C., Sehested J., Hansen P.L., Clausen B.S., Rostrup-Nielsen J.R., Abild-Pedersen F., and Nørskov J.K. Nature 427 (2004) 426
10. Jaeger N.I. Science 293 (2001) 1601
11. Topsøe H. J. Catal. 216 (2003) 155
12. Williamson M.J., Tromp R.M., Vereecken P.M., Hull R., and Ross F.M. Nat. Mater. 2 (2003) 532
13. Green E.D., and Kino G.S. J. Vac. Sci. Technol. B 9 (1991) 1557
14. Zhang M., Olson E.A., Twesten R.D., Wen J.G., Allen L.H., Robertson I.M., and Petrov I. J. Mater. Res. 20 (2005) 1802
15. Olson E.A., Efremov M.Y., Zhang M., Zhang Z., and Allen L.H. J. Microelectromech. Syst. 12 (2003) 355
16. Arana L.A., Schaevitz S.B., Franz A.J., Schmidt M.A., and Jensen K.F. J. Microelectromech. Syst. 12 (2003) 600
17. Tiggelaar R.M., van Male P., Berenschot J.W., Gardeniers J.G.E., Oosterbroek R.E., de Croon M.H.J.M., Schouten J.C., van den Berg A., and Elwenspoek M.C. Sensors Actuators A 119 (2005) 196
18. French P.J., Sarro P.M., Mallée R., Fakkeldij E.J.M., and Wolffenbuttel R.F. Sensors Actuators A 58 (1997) 149
19. Doll T., Hochberg M., Barsic D., and Scherer A. Sensors Actuators A 87 (2000) 52
20. Yang J., and Paul O. Sensors Actuators A 97-98 (2002) 520
21. van Rijn C., van der Wekken M., Nijdam W., and Elwenspoek M. J. Microelectromech. Syst. 6 (1997) 48
22. Briand D., Krauss A., van der Schoot B., Weimar U., Barsan N., Göpel W., and de Rooij N.F. Sensors Actuators B 68 (2000) 223
23. Hierlemann A., Brand O., Hagleitner C., and Baltes H. Proc. IEEE 91 (2003) 839
24. Solzbacher F., Imawan C., Steffels H., Obermeier E., and Eickhoff M. Sensors Actuators B 77 (2001) 111
25. Briand D., Beaudoin F., Courbat J., de Rooij N.F., Desplats R., and Perdu P. Microelectron. Reliab. 45 (2005) 1786
26. Firebaugh S.L., Jensen K.F., and Schmidt M.A. J. Microelectromech. Syst. 7 (1998) 128
27. Hansen P.L., Wagner J.B., Helveg S., Rostrup-Nielsen J.R., Clausen B.S., and Topsøe H. Science 295 (2002) 2053
28. Dulub O., Boatner L.A., and Diebold U. Surf. Sci. 504 (2002) 271
29. Schaffer B., Grogger W., and Kothleitner G. Ultramicroscopy 102 (2004) 27
30. Egerton R.F. Electron Energy-Loss Spectroscopy in the Electron Microscope. second ed. (1996), Plenum Press, New York