SCOPUS 정보 검색 플랫폼

Nature

Volumn 418, Issue 6898, 2002, Pages 617-620

Sub-aångstrom resolution using aberration corrected electron optics

(3) Batson, P E a Dellby, N b Krivanek, O L b

a IBM T J WATSON RESEARCH CENTER (United States)

b Nion Co Kirkland (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; LENSES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS;

SPATIAL RESOLUTION;

ELECTRON OPTICS;

CARBON; SILICON;

ELECTRO-OPTICAL TECHNIQUE;

ARTICLE; COMPUTER SYSTEM; ELECTRON; ELECTRON BEAM; ELECTRON MICROSCOPY; ENERGY; IMAGING SYSTEM; LENS; OPTICS; PRIORITY JOURNAL; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SEMICONDUCTOR;

EID: 0037043685 PISSN: 00280836 EISSN: None Source Type: Journal
DOI: 10.1038/nature00972 Document Type: Article

Times cited : (844)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.