Future trends in aberration-corrected electron microscopy

Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences

Volumn 367, Issue 1903, 2009, Pages 3809-3823

  Rose, Harald H ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Aberration correction; Achromatic aplanat; Coma free lens; Phase shifter

Indexed keywords

ATOMS; ELECTRIC WINDINGS; ELECTRON MICROSCOPES; ELECTRONS; OPTICAL INSTRUMENT LENSES; OPTICAL RESOLVING POWER; PHASE SHIFT; PHASE SHIFTERS; RADIATION DAMAGE; TRANSMISSION ELECTRON MICROSCOPY;

ABERRATION CORRECTION; ABERRATION-CORRECTED ELECTRON MICROSCOPY; ACHROMATIC APLANAT; APLANAT; ATOM DISPLACEMENTS; ATOMIC NUCLEI; ATOMIC RESOLUTION; CHROMATIC ABERRATION; COMA-FREE LENS; CONTRAST MODES; FREE PHASE; FUTURE TRENDS; IMAGE POINTS; IMAGING CONDITIONS; INCIDENT ELECTRONS; INSTRUMENTAL RESOLUTION; LOW-VOLTAGE; OBJECTIVE LENS; PHASE CONTRASTS; PHASE TRANSMISSION; SCATTERED WAVES; SCATTERING CONTRAST; SPHERICAL ABERRATIONS;

ABERRATIONS;

EID: 70349436154     PISSN: 1364503X     EISSN: None     Source Type: Journal    
DOI: 10.1098/rsta.2009.0062     Document Type: Article

References (11)

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