An x-ray photoemission electron microscope using an electron mirror aberration corrector for the study of complex materials

Journal of Physics Condensed Matter

Volumn 17, Issue 16, 2005, Pages

  Feng, J ^a   Forest, E ^b   MacDowell, A A ^a   Marcus, M ^a   Padmore, H ^a   Raoux, S ^c   Robin, D ^a   Scholl, A ^a   Schlueter, R ^a   Schmid, P ^a   Stohr J ^d   Wan, W ^a   Wei, D H ^e   Wu, Y ^f  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

^c IBM ALMADEN RESEARCH CENTER   (United States)

^d SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^e NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

^f DUKE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; COMPOSITION; ELECTRON MICROSCOPY; LIGHT SOURCES; MAGNETIC PROPERTIES; X RAYS;

ADVANCED LIGHT SOURCES (ALS); CHROMATIC ABERRATIONS; MAGNETIC BEAM SEPARATORS; PHOTOEMISSION ELECTRON MICROSCOPE;

PHOTOEMISSION;

EID: 24344497883     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/17/16/005     Document Type: Article

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