Breaking the spherical and chromatic aberration barrier in transmission electron microscopy

Ultramicroscopy

Volumn 102, Issue 3, 2005, Pages 209-214

  Freitag, B ^a   Kujawa, S ^a   Mul, P M ^a   Ringnalda, J ^a   Tiemeijer, P C ^a  

^a Thermo Fisher Scientific   (United States)

Author keywords

01, 31; Aberration correction; High resolution TEM; Monochromator

Indexed keywords

CHROMATIC ABERRATIONS; CHROMATIC BLUR; SPHERICAL ABERRATION CORRECTORS; SPHERICAL ABERRATIONS;

ABERRATIONS; ELECTRON BEAMS; ELECTRON LENSES; IMAGE RECONSTRUCTION; MONOCHROMATORS; OPTICAL RESOLVING POWER; THREE DIMENSIONAL; TOMOGRAPHY;

TRANSMISSION ELECTRON MICROSCOPY;

ARTICLE; ELECTRON; IMAGING; MATHEMATICAL ANALYSIS; MATHEMATICAL MODEL; SIGNAL NOISE RATIO; STATISTICAL SIGNIFICANCE; TRANSMISSION ELECTRON MICROSCOPY;

LENSES; MICROSCOPY, ELECTRON, TRANSMISSION; OPTICS;

EID: 11444253481     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2004.09.013     Document Type: Article

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