Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-Å information limit

Microscopy and Microanalysis

Volumn 14, Issue 5, 2008, Pages 469-477

  Kisielowski, C ^a   Freitag, B ^e   Bischoff, M ^e   Van Lin, H ^e   Lazar, S ^e   Knippels, G ^e   Tiemeijer, P ^e   Van Der Stam, M ^e   Von Harrach, S ^e   Stekelenburg, M ^e   Haider, M ^f   Uhlemann, S ^f   Muller H ^f   Hartel, P ^f   Kabius, B ^b   Miller, D ^b   Petrov, I ^c   Olson, E A ^c   Donchev, T ^c   Kenik, E A ^d   Lupini, A R ^d   Bentley, J ^d   Pennycook, S J ^d   Anderson, I M ^d   Minor, A M ^a   Schmid, A K ^a   Duden, T ^a   Radmilovic, V ^a   Ramasse, Q M ^a   Watanabe, M ^a   Erni, R ^a   Stach, E A ^a   Denes, P ^a   Dahmen, U ^a   more..

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^d OAK RIDGE NATIONAL LABORATORY   (United States)

^e Thermo Fisher Scientific   (United States)

^f CEOS GmbH   (Germany)

Author keywords

Aberration correcting optics; Atomic structure; Buried defect; Sub angstrom; TEM STEM

Indexed keywords

EID: 52149103148     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608080902     Document Type: Article

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