Automated most-probable loss tomography of thick selectively stained biological specimens with quantitative measurement of resolution improvement

Journal of Structural Biology

Volumn 148, Issue 3, 2004, Pages 297-306

  Bouwer, James C ^a   MacKey, Mason R ^a   Lawrence, Albert ^a   Deerinck, Tom J ^a   Jones, Ying Z ^a   Terada, Masako ^a   Martone, Maryann E ^a   Peltier, Steven ^a   Ellisman, Mark H ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Electron energy loss spectroscopy; Electron microscopy; Most probable loss imaging; Thick specimen imaging; Tomography

Indexed keywords

ARTICLE; AUTOANALYSIS; ELECTRIC POTENTIAL; ELECTRON MICROSCOPY; ELECTRON TRANSPORT; INTERMEDIATE VOLTAGE ELECTRON MICROSCOPY; MICROSCOPE IMAGE; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; SIGNAL NOISE RATIO; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

ANIMALS; DENDRITES; ELECTRONS; HIPPOCAMPUS; IMAGE PROCESSING, COMPUTER-ASSISTED; LABORATORY TECHNIQUES AND PROCEDURES; MICE; MICROSCOPY, ELECTRON; MICROSCOPY, ELECTRON, TRANSMISSION; MODELS, STATISTICAL; MODELS, THEORETICAL; SCATTERING, RADIATION; STAINING AND LABELING; TOMOGRAPHY;

EID: 7444230915     PISSN: 10478477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jsb.2004.08.005     Document Type: Article

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