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Volumn 88, Issue 4, 2001, Pages 243-252

Transmission electron microscopy with Zernike phase plate

Author keywords

Contrast transfer function; Phase contrast; Phase plate; Transmission electron microscope

Indexed keywords

OPTICAL INSTRUMENT LENSES; THIN FILMS;

EID: 0034903709     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(01)00088-2     Document Type: Article
Times cited : (257)

References (22)
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    • K. Danov, R. Danev, K. Nagayama, Reconstruction of the electric charge density in thin films from contrast transfer function measurements, Ultramicroscopy, submitted for publication.
  • 15
    • 0004451694 scopus 로고    scopus 로고
    • Transmission Electron Microsocpy, Physics of Image Formation and Microanalysis, 4th Edition, New York: Springer
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    • Reimer, L.1
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    • W. Bigelow, in: A. Glauert (Ed.), Vacuum Methods in Electron Microscopy, Practical Methods in Electron Microscopy, Vol. 15, Portland Press, London, 1994.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.