4D imaging of transient structures and morphologies in ultrafast electron microscopy

Science

Volumn 322, Issue 5905, 2008, Pages 1227-1231

  Barwick, Brett ^a   Hyun, Soon Park ^a   Kwon, Oh Hoon ^a   Baskin, J Spencer ^a   Zewail, Ahmed H ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COOLING; ELECTRON MICROSCOPY; IMAGING METHOD;

ARTICLE; DIFFRACTION; DYNAMIC EXERCISE; ELECTRON; ELECTRON MICROSCOPY; IMAGING; NANOANALYSIS; PRIORITY JOURNAL; TEMPERATURE; THREE DIMENSIONAL IMAGING;

CRYSTALLOGRAPHY; GOLD; GRAPHITE; MICROSCOPY, ELECTRON; TIME;

EID: 56749155085     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1164000     Document Type: Article

References (42)

1. M. Knoll, E. Ruska, Z. Phys. 78, 318 (1932).
2. A. V. Crewe, J. Wall, J. Langmore, Science 168, 1338 (1970).
3. M. Haider et al., Nature 392, 768 (1998).
4. D. A. Muller et al., Science 319, 1073 (2008).
5. P. E. Batson, N. Dellby, O. L. Krivanek, Nature 418, 617 (2002).
6. K. Kimoto et al., Nature 450, 702 (2007).
7. M. A. O'Keefe, Ultramicroscopy 108, 196 (2008) and references therein.
8. D. J. De Rosier, A. Klug, Nature 217, 130 (1968).
9. R. Henderson, Q. Rev. Biophys. 37, 3 (2004).
10. V. Lucic, F. Förster, W. Baumeister, Annu. Rev. Biochem. 74, 833 (2005).
11. A. Komeili, Z. Li, D. K. Newman, G. J. Jensen, Science 311, 242 (2006).
12. W. Jiang et al., Nature 439, 612 (2006).
13. X. D. Zou, S. Hovmöller, Acta Crystallogr. A 64, 149 (2008).
14. P. W. Hawkes, J. C. H. Spence, Eds., Science of Microscopy (Springer, New York, 2006), vol. 1.
15. J. M. Thomas, in Physical Biology: From Atom to Medicine A. H. Zewail, Ed. (Imperial College Press, London, 2008).
16. A. Howie, P. M. Midgley, C. J. Humphreys, O. Terasaki, in Turning Points in Solid-State, Materials and Surface Science K. D. M. Harris, P. P. Edwards, Eds. (Royal Society of Chemistry, Cambridge, 2008).
17. E. D. Boyes, P. L. Gai, Ultramicroscopy 67, 219 (1997).
18. A. H. Zewail, Annu. Rev. Phys. Chem. 57, 65 (2006) and references therein.
19. H. Dömer, O. Bostanjoglo, Rev. Sci. Instrum. 74, 4369 (2003).
20. T. Lagrange et al., Acta Mater. 55, 5211 (2007).
21. A. Gahlmann, S. T. Park, A. H. Zewail, Phys. Chem. Chem. Phys. 10, 2894 (2008).
22. H. S. Park, J. S. Baskin, O.-H. Kwon, A. H. Zewail, Nano Lett. 7, 2545 (2007).
23. O.-H. Kwon et al., Proc. Natl. Acad. Sci. U.S.A. 105, 8519 (2008).
24. A. H. Zewail, V. A. Lobastov, Method and system for ultrafast photo-electron microscope, US Patent 7,154,091 B2, 20050401 (2006).
25. A. H. Zewail, in Visions of Discovery: Shedding New Light on Physics and Cosmology, R. Chiao, W. Phillips, A. Leggett, M. Cohen, G. Ellis, D. York, R. Bishop, C. Harper, Eds. (Cambridge University Press, Cambridge, 2008), chap. 2.
26. B. Fultz, J. M. Howe, Transmission Electron Microscopy and Diffractometry of Materials (Springer, New York, 2002).
27. The deviation from 1 in the correlation of independent measurements for the same real image pattern is a measure of the overall scale of image relief relative to the random noise contribution in the frames. Thus, a flatter image, relative to the noise, will have a smaller γ value for independently recorded frames; see, for example, the slight difference in baseline values in Fig. 2C.
28. The width rises because of the induced structural inhomogeneity, as expected, and near t = 0 an initial decrease is noted, which indicates that the overall temporal response is much faster than that of the amplitude or separation rise.
29. J. Hohlfeld et al., Chem. Phys. 251, 237 (2000).
30. G. Ertl, Adv. Catal. 45, 1 (2000).
31. ?1. A higher ΔT derived from the intensity changes (Debye-Waller factor) may have some contribution from zone-axis tilt. Because the zone axis was along the [100] direction before the arrival of the heat impulse, the influence of tilting would make the derived ΔT a maximum value.
32. O. L. Blakslee, D. G. Proctor, E. J. Seldin, G. B. Spence, T. Weng, J. Appl. Phys. 41, 3373 (1970).
33. W. N. Reynolds, Physical Properties of Graphite (Elsevier, Amsterdam, 1968).
34. C. Lee, X. Wei, J. W. Kysar, J. Hone, Science 321, 385 (2008).
35. D. G. Davies, Philos. Trans. R. Soc. Lond. A 320, 243 (1986).
36. P. B. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley, M. J. Whelan, Electron Microscopy of Thin Crystals (Butterworths, London, 1965).
37. F. E. Fujita, K. Izui, J. Phys. Soc. Jpn. 16, 214 (1961).
38. S. K. Choudhary, A. K. Gupta, Jpn. J. Appl. Phys. 46, 7450 (2007).
39. Z. L. Wang, Elastic and Inelastic Scattering in Electron Diffraction and Imaging (Plenum, New York, 1995).
40. D. Shindo, K. Hiraga, High-Resolution Electron Microscopy for Materials Science (Springer-Verlag, Tokyo, 1998).
41. O.-H. Kwon et al., Nano Lett. 8, 3557 (2008).
42. We thank F. Carbone for his handling of the graphite film and for helpful discussion. This work was supported by the National Science Foundation and Air Force Office of Scientific Research in the Gordon and Betty Moore Center for Physical Biology at Caltech. Research on biological UEM imaging was supported by the National Institutes of Health. Caltech has filed a provisional patent application for the microscope described here.