High-resolution electron microscopy and electron tomography: Resolution versus precision

Journal of Structural Biology

Volumn 138, Issue 1-2, 2002, Pages 21-33

  Van Aert, S ^a   Den Dekker, A J ^a   Van Dyck, D ^b   Van Den Bos, A ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

Electron tomography; High resolution electron microscopy; Precision; Resolution

Indexed keywords

ACCURACY; CALCULATION; CONFERENCE PAPER; DENSITY; ELECTRON MICROSCOPY; IMAGE ANALYSIS; MEASUREMENT; MODEL; PRIORITY JOURNAL; ROTATION; TOMOGRAPHY; ARTICLE; COMPUTER ASSISTED TOMOGRAPHY; IMAGE PROCESSING; METHODOLOGY; SENSITIVITY AND SPECIFICITY; THEORETICAL MODEL;

IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ELECTRON; MODELS, THEORETICAL; SENSITIVITY AND SPECIFICITY; TOMOGRAPHY, X-RAY COMPUTED;

EID: 0036417291     PISSN: 10478477     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1047-8477(02)00016-3     Document Type: Conference Paper

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