Electron microscopy image enhanced [7]

Nature

Volumn 392, Issue 6678, 1998, Pages 768-769

  Haider, M ^a   Uhlemann, S ^a   Schwan, E ^a   Rose, G ^a   Kabius, B ^a   Urban, K ^a  

^a CEOS GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT DERIVATIVE; SILICON DERIVATIVE;

ARTIFACT; DIFFRACTION; ELECTRON MICROSCOPY; IMAGE QUALITY; LENS; LETTER; PRIORITY JOURNAL; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0032560108     PISSN: 00280836     EISSN: None     Source Type: Journal    
DOI: 10.1038/33823     Document Type: Letter

References (10)