Elemental mapping at the atomic scale using low accelerating voltages

Ultramicroscopy

Volumn 110, Issue 8, 2010, Pages 926-934

  Botton, Gianluigi A ^a   Lazar, Sorin ^a,b   Dwyer, Christian ^c  

^a MCMASTER UNIVERSITY   (Canada)

^b Thermo Fisher Scientific   (United States)

^c MONASH UNIVERSITY   (Australia)

Author keywords

Contrast; Electron energy loss spectroscopy; Elemental mapping; High resolution mapping; Multislice calculations; Signal to noise ratio; STEM

Indexed keywords

ACQUISITION TIME; ATOMIC SCALE; ATOMICALLY SHARP INTERFACE; DETECTION LIMITS; ELECTRON BEAM DAMAGE; ELEMENTAL MAPPING; ELEMENTAL MAPS; ENERGY POSITION; HIGH SIGNAL-TO-NOISE RATIO; HIGH-ANGLE ANNULAR DARK-FIELD IMAGES; HIGH-RESOLUTION MAPPING; INTEGRATION WINDOW; LOW ACCELERATING VOLTAGE; MULTISLICE CALCULATIONS; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SRTIO;

ATOMS; BARIUM; DISSOCIATION; ELECTRON BEAMS; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; FADING (RADIO); MAPPING; NUCLEAR INSTRUMENTATION; SIGNAL DETECTION; SIGNAL TO NOISE RATIO; STRONTIUM ALLOYS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

BARIUM; STRONTIUM; TITANIUM;

ARTICLE; ATOM; CALCULATION; CHEMICAL ANALYSIS; CHEMICAL PROCEDURES; CONTROLLED STUDY; ELASTICITY; ELECTRIC POTENTIAL; ELECTRON BEAM; ELECTRON PROBE MICROANALYSIS; ELEMENTAL MAPPING; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; INTERFACE PRESSURE; NUCLEAR ENERGY; SCANNING ELECTRON MICROSCOPE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIGNAL NOISE RATIO;

EID: 77955514908     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.03.008     Document Type: Article

References (28)

1. Haider M., Rose H., Uhlemann S., Schwan E., Kabius B., Urban K. Ultramicroscopy 1998, 75:53-60.
2. Haider M., Rose H., Uhlemann S., Kabius B., Urban K. Journal of Electron Microscopy 1998, 47:395-405.
3. Haider M., Uhlemann S., Schwan E., Rose H., Kabius B., Urban K. Nature 1998, 392:768-769.
4. Krivanek O.L., Dellby N., Lupini A.R. Ultramicroscopy 1999, 78:1-11.
5. Krivanek O.L., Nellist P.D., Dellby N., Murfitt M.F., Szilagyi Z. Ultramicroscopy 2003, 96:229.
6. B. Freitag et al., in: Proceedings of the Microscopy and Microanalysis 2005,.
7. Kimoto K., Asaka T., Nagai T., Saito M., Matusui Y., Ishizuka K. Nature 2007, 450:702.
8. Muller D.A. Nature Materials 2009, 8:263.
9. Bosman M., Keast V.J., Garcia-Munoz J.L., D'Alfonso A.J., Findlay S.D., Allen L.J., Garcia-Munoz Physical Review Letters 2007, 99:086102.
10. Sawada et al., Ultramicroscopy, these proceedings, doi: 10.1016/j.ultramic.2010.01.010.
11. M. Barfels, Gatan Course Notes on Spectrometers design.
12. Kisielowski C., Freitag B., Bischoff M., van Lin H., Lazar S., Knippels G., Tiemeijer P., van der Stam M., von Harrach S., Stekelenburg M., Haider M., Muller H., Hartel P., Kabius B., Miller D., Petrov I., Olson E., Donchev T., Kenik E.A., Lupini A., Bentley J., Pennycook S., Minor A.M., Schmid A.K., Duden T., Radmilovic V., Ramasse Q., Erni R., Watanabe M., Stach E., Denes P., Dahmen U. Microscopy and Microanalysis 2008, 14:454-462.
13. C. Dwyer, R. Erni, J. Etheridge, Ultramicroscopy, these proceedings, doi: 10.1016/j.ultramic.2010.01.007.
14. Erni R., Rossell M.D., Kisielowski C., Dahmen U. Physical Review Letters 2009, 102:096101.
15. Gautreau O., Harnagea C., Gunawan L., et al. Journal of Physics D: Applied Physics 2008, 41:112002.
16. Poppe U., Klein N., Dhne U., Soltner H., Jia C.L., Kabuis B., Urban K., Lubig A., Schmidt K., Hensen S., Orbach S., Müller G., Piel H. Journal of Applied Physics 1992, 71:5572.
17. Dwyer C. Ultramicroscopy 2005, 104:141-151.
18. Dwyer C. Physical Review B 2005, 72:144102.
19. Dwyer C., Findlay S.D., Allen L.J. Physical Review B 2008, 77:184107.
20. Egerton R.F. EELS In The Electron Microscope 1996, Plenum Press, New York, Page 277.
21. Kothleitner G., Hofer F. Micron 1998, 29:349-357.
22. D'Alfonso A.J., Findlay S.D., Oxley M.P., Allen L.J. Ultramicroscopy 2008, 108:677-687.
23. S. Lazar, Y. Shao, L. Gunawan, R. Nechache, A. Pignolet, G.A. Botton, Microscopy and Microanalysis, Accepted (2010).
24. Botton G.A., L'Esperance G. Ultramicroscopy 1992, 41:287-290. references therein.
25. Thomas B.S., Marks N.A., Begg B.D. Nuclear Instruments and Methods in Physics Research B 2007, 254:211-218.
26. Muller D.A., Silcox J. Philosophical Magazine B 1995, 7:1375.
27. Muller D.A., Fitting-Kourkoutis L., Song J.H., Hwang H.Y., Silcox J., Dellby N., Krivanek O.L. Science 2008, 319:1073-1076. Supplementary materials.
28. Gunawan L., Lazar S., Gautreau O., Hargagea C., Pignolet A., Botton G.A. Applied Physics Letters 2009, 95:192902.