Atomic resolution imaging of a carbon nanotube from diffraction intensities

Science

Volumn 300, Issue 5624, 2003, Pages 1419-1421

  Zuo, J M ^a   Vartanyants, I ^a,c   Gao, M ^a   Zhang, R ^b   Nagahara, L A ^b  

^a University of Illinois at Urbana Champaign   (United States)

^b MOTOROLA INC   (United States)

^c RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; CRYSTALS; DIFFRACTION; ELECTRONS; IMAGING TECHNIQUES; NANOSTRUCTURED MATERIALS;

ATOMIC RESOLUTION IMAGING;

CARBON NANOTUBES;

CARBON; NANOPARTICLE;

CARBON; NANOTECHNOLOGY;

ARTICLE; ATOMIC PARTICLE; DIFFRACTION; IMAGE ANALYSIS; IMAGING SYSTEM; LIGHT INTENSITY; LIGHT SCATTERING; NANOTECHNOLOGY; OPTICAL RESOLUTION; PRIORITY JOURNAL; TECHNIQUE;

EID: 0038780636     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.1083887     Document Type: Article

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25. Work on electron microscopy characterization was supported by DOE DEFG02-01ER45923 and DEFG02-91ER45439 and the TEM facility of Center for Micro-analysis of Materials at the Frederick Seitz Materials Research Laboratory. We thank J. H. Weaver, I. Robinson, S. Granick, R. Twesten, I. Petrov, R. Tsui, and H. Goronkin for discussion and encouragement.