Towards sub-Å electron beams

Ultramicroscopy

Volumn 78, Issue 1-4, 1999, Pages 1-11

  Krivanek, O L ^a,b   Dellby, N ^a   Lupini, A R ^c  

^a Nion Co Kirkland   (United States)

^b Box 352120 University of Washington ^*  (United States)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Aberration correction; Octupoles; Quadrupoles; STEM

Indexed keywords

CONFERENCE PAPER; DEVICE; ELECTRON; ELECTRON BEAM; ELECTRON DIFFRACTION; IMAGE ANALYSIS; MATHEMATICAL COMPUTING; OPTICAL INSTRUMENTATION; PARTICLE SIZE; SCANNING ELECTRON MICROSCOPE; SCANNING ELECTRON MICROSCOPY;

EID: 0033044079     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00013-3     Document Type: Conference Paper

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