Atomic and subnanometer resolution in ambient conditions by atomic force microscopy

Surface Science Reports

Volumn 64, Issue 3, 2009, Pages 99-121

  Gan, Yang ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Atomic force microscopy; Atomic resolution; Lattice resolution; Molecular resolution; Subnanometer resolution

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMS;

AFM; AMBIENT CONDITIONS; ATOMIC RESOLUTION; ATOMIC-FORCE MICROSCOPIES; BIOLOGICAL SAMPLES; CRITICAL REVIEWS; HIGH-RESOLUTION TECHNIQUES; LATTICE RESOLUTION; MOLECULAR RESOLUTION; OPERATION MODES; REPRODUCIBILITY; STRUCTURAL INFORMATIONS; SUBNANOMETER; SUBNANOMETER RESOLUTION; SURFACE FORCES;

ATOMIC PHYSICS;

EID: 59849116969     PISSN: 01675729     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfrep.2008.12.001     Document Type: Review

References (220)

1. Binnig G., Quate C.F., and Gerber C. Physical Review Letters 56 (1986) 930
2. Ohnesorge F., and Binnig G. Science 260 (1993) 1451
3. Giessibl F.J. Reviews of Modern Physics 75 (2003) 949
4. Giessibl F.J. Materials Today 8 (2005) 32
5. Hofer W.A., Foster A.S., and Shluger A.L. Reviews of Modern Physics 75 (2003) 1287
6. Seo Y., and Jhe W. Reports on Progress in Physics 71 (2008) 016101
7. Binnig G., and Rohrer H. Reviews of Modern Physics 71 (1999) S324
8. Belikov S., and Magonov S. Japanese Journal of Applied Physics 45 (2006) 2158
9. Klinov D., and Magonov S. Applied Physics Letters 84 (2004) 2697
10. Möller C., Allen M., Elings V., Engel A., and Müller D.J. Biophysical Journal 77 (1999) 1150
11. Martin Y., Williams C.C., and Wickramasinghe H.K. Journal of Applied Physics 61 (1987) 4723
12. Patil S.V., and Hoffmann P.M. Advanced Engineering Materials 7 (2005) 707
13. Drake B., Prater C.B., Weisenhorn A.L., Gould S.A.C., Albrecht T.R., Quate C.F., Cannell D.S., Hansma H.G., and Hansma P.K. Science 243 (1989) 1586
14. Wade T., Garst J.F., and Stickney J.L. Review of Scientific Instruments 70 (1999) 121
15. Butt H.-J., and Jaschke M. Nanotechnology 6 (1995) 1
16. Smith D.P.E. Review of Scientific Instruments 66 (1995) 3191
17. Shao Z., Mou J., Czajkowsky D.M., Yang J., and Yuan J.Y. Advances in Physics 45 (1996) 1
18. Moiseev Y.N., Mostepanenko V.M., Panov V.I., and Sokolov I.Y. Physics Letters A 132 (1988) 354
19. Bustamante C., Rivetti C., and Keller D.J. Current Opinion in Structural Biology 7 (1997) 709
20. Fang S.J., Haplepete S., Chen W., Helms C.R., and Edwards H. Journal of Applied Physics 82 (1997) 5891
21. Kato K., Bar G., and Cantow H.J. European Physical Journal E 6 (2001) 7
22. Stahlberg H., Fotiadis D., Scheuring S., Rémigy H., Braun T., Mitsuoka K., Fujiyoshi Y., and Engel A. FEBS Letters 504 (2001) 166
23. Butt H.-J., Cappella B., and Kappl M. Surface Science Reports 59 (2005) 1
24. Castellanos A. Advances in Physics 54 (2005) 263
25. Girard C., Joachim C., and Gauthier S. Reports on Progress in Physics 63 (2000) 893
26. Israelachvili J.N. Intermolecular and Surface Forces (2001), Academic Press, London
27. Rowlinson J.S. Cohesion: A Scientific History of Intermolecular Forces (2002), Cambridge University Press, Cambridge
28. Leggett G.J., Brewer N.J., and Chong K.S.L. Physical Chemistry Chemical Physics 7 (2005) 1107
29. Schwarz U.D. Journal of Colloid and Interface Science 261 (2003) 99
30. Weihs T.P., Nawaz Z., Jarvis S.P., and Pethica J.B. Applied Physics Letters 59 (1991) 3536
31. Heuberger M., Dietler G., and Schlapbach L. Journal of Vacuum Science and Technology B 14 (1996) 1250
32. Luan B., and Robbins M.O. Nature 435 (2005) 929
33. Bergström L. Advance in Colloid and Interface Science 70 (1997) 125
34. Argento C., and French R.H. Journal of Applied Physics 80 (1996) 6081
35. Hillier A.C., Kirn S., and Bard A.J. Journal of Physical Chemistry 100 (1996) 18808
36. Das S., Sreeram P.A., and Raychaudhuri A.K. Nanotechnology 18 (2007) 035501
37. Buldum A., Ciraci S., Fong C.Y., and Nelson J.S. Physical Review B 59 (1999) 5120
38. Hartmann U. Physical Review B 43 (1991) 2404
39. Henderson M.A. Surface Science Reports 46 (2002) 1
40. Asay D.B., and Kim S.H. Review of Scientific Instruments 77 (2006) 043903
41. Grobelny J.P., Pradeep N., Kim D.-I., and Ying Z.C. Applied Physics Letters 88 (2004) 091906
42. Bouhacina T., Desbat B., and Aimé J.P. Tribology Letters 9 (2000) 111
43. Sirghi L., Szoszkiewicz R., and Riedo E. Langmuir 22 (2006) 1093
44. Stifter T., Marti O., and Bhushan B. Physical Review B 62 (2000) 13667
45. Foster A.S., and Hofer W.A. Scanning Probe Microscopy - Atomic Scale Engineering by Forces and Currents (2006), Springer, Berlin
46. Kaplan I.G. Intermolecular Interactions: Physical Picture, Computational Methods and Model Potentials (2006), John Wiley & Sons Ltd, West Sussex
47. Wiesendanger R. Scanning Probe Microscopy and Spectroscopy: Methods and Applications (1994), Cambridge University Press, Cambridge
48. Wiesendanger R., Morita S., and Meyer E. Noncontact Atomic Force Microscopy (2002), Springer-Verlag, Berlin
49. Guntherödt H.J., Anselmetti D., and Meyer E. Forces in Scanning Probe Methods (1995), Kluwer, Dordrecht
50. Sugimoto Y., Pou P., Abe M., Jelinek P., Peréz R., Morita S., and Custance O. Nature 446 (2007) 64
51. Cleveland J.P., Schaffer T.E., and Hansma P.K. Physical Review B 52 (1995) R8692
52. Girard C. Physical Review B 43 (1991) 8822
53. Koga K. Physical Review B 60 (1999) 14328
54. Koga K., and Zeng X.C. Physical Review Letters 79 (1997) 853
55. Shaw D.J. Introduction to Colloid and Surface Chemistry (1992), Butterworth Heinemann, Oxford
56. Müller D.J., Schabert F.A., Büldt G., and Engel A. Biophysical Journal 68 (1995) 1681
57. Scheuring S., Lévy D., and Rigaud J.L. Biochimica et Biophysica Acta - Biomembranes 1712 (2005) 109
58. Sokolov I.Y. Tribology Letters 12 (2002) 131
59. Sokolov I.Y. Applied Surface Science 210 (2003) 37
60. Sokolov I.Y., Henderson G.S., and Wicks F.J. Applied Surface Science 140 (1999) 422
61. Sokolov I.Y., and Henderson G.S. Applied Surface Science 157 (2000) 302
62. Sokolov I.Y., Henderson G.S., Wicks F.J., and Ozin G.A. Applied Physics Letters 70 (1997) 844
63. Sokolov I.Y., Henderson G.S., and Wicks F.J. Journal of Applied Physics 86 (1999) 5537
64. Sirghi L., Kylian O., Gilliland D., Ceccone G., and Rossi F. Journal of Physical Chemistry B 110 (2006) 25975
65. Erlandsson R., and Apell P. Current Science 78 (2000) 1445
66. Sokolov I.Y., and Henderson G.S. Surface Science 449 (2002) 135
67. Jarvis M.R., Pérez R., and Payne M.C. Physical Review Letters 86 (2001) 1287
68. Zhong W., Overney G., and Tomanek D. Europhysics Letters 15 (1991) 49
69. Overney G., Zhong W., and Tomanek D. Journal of Vacuum Science and Technology B 9 (1991) 479
70. Schwarz U.D., Hölscher H., and Wiesendanger R. Physical Review B 62 (2000) 13089
71. Ohnesorge F.M. Physical Review B 61 (2000) R5121
72. DeRose J.A., and Revel J.-P. Microscopy and Microanalysis 3 (1997) 203
73. Chung K.H., Lee Y.H., and Kim D.E. Ultramicroscopy 102 (2005) 161
74. Lo Y.S., Huefner N.D., Chan W.S., Dryden P., Hagenhoff B., and Beebe Jr. J. Langmuir 15 (1999) 6522
75. Abu-Lail N.I., and Camesano T.A. Journal of Microscopy 212 (2003) 217
76. Nie H.-Y., and McIntyre N.S. Langmuir 17 (2001) 432
77. Hübner U., Morgenroth W., Meyer H.G., Sulzbach T., Brendel B., and Mirande W. Applied Physics A 76 (2003) 913
78. Moeck P. Proceedings of SPIE 6000 (2005) 60000Q
79. Bykov V., Gologanov A., and Shevyakov V. Applied Physics A 66 (1998) 499
80. Aumond B.D., and Youcef-Toumi K. Proceedings of SPIE 4344 (2001) 46
81. Gutiérrez H.R., Nakabayashi D., Silva P.C., Bortoleto J.R.R., Rodrigues V., Clerici J.H., Cotta M.A., and Ugarte D. Physica Status Solidi 201 (2004) 888
82. Spatz J.P., Sheiko S.S., and Möller M. Ultramicroscopy 75 (1998) 1
83. Skårman B., Wallenberg L.R., Jacobsen S.N., Helmersson U., and Thelander C. Langmuir 16 (2000) 6267
84. Su C.M., Huang L., Kjoller K., and Babcock K. Ultramicroscopy 97 (2003) 135
85. Dongmo S., Troyon M., Vautrot P., Delain E., and Bonnet N. Journal of Vacuum Science and Technology B 14 (1996) 1552
86. Yam C.M., Xiao Z., Gu J., Boutet S., and Cai C. Journal of the American Chemical Society 125 (2003) 7498
87. Jacobsen S.N., Helmersson U., Erlandsson R., Skårman B., and Wallenberg L.R. Surface Science 429 (1999) 22
88. Machleidt T., Franke K.H., Romanus H., Cimalla V., Niebelschütz M., Spieß L., and Ambacher O. Ultramicroscopy 107 (2007) 1086
89. Vick D., Brett M.J., and Westra K. Thin Solid Films 408 (2002) 79
90. Dongmo L.S., Villarrubia J.S., Jones S.N., Renegar T.B., Postek M.T., and Song J.F. Ultramicroscopy 85 (2000) 141
91. Taatjes D.J., Quinn A.S., Lewis M.R., and Bovill E.G. Microscopy Research and Technique 44 (1999) 312
92. Sheiko S.S., Möller M., Reuvekamp E.M.C.M., and Zandbergen H.W. Physical Review B 48 (1993) 5675
93. Gan Y., and Franks G.V. Journal of Physical Chemistry B 109 (2005) 12474
94. Klinov D., Dwir B., Kapon E., Borovok N., Molotsky T., and Kotlyar A. Nanotechnology 18 (2007) 225102
95. Magonov S.N. Proceedings of SPIE 6002 (2005) 60020S
96. D. Fotiadis, A. Engel, in: P.C. Braga, D. Ricci (Eds.), Totowa, NJ, 2004, p. 291
97. Fukuma T., Kobayashi K., Matsushige K., and Yamada H. Applied Physics Letters 86 (2005) 1
98. Müller D.J., Fotiadis D., Scheuring S., Müller C., and Engel A. Single Molecules 1 (2000) 115
99. Müller D.J., Fotiadis D., Scheuring S., Müller S.A., and Engel A. Biophysical Journal 76 (1999) 1101
100. Hoogenboom B.W., Hug H.J., Pellmont Y., Martin S., Frederix P.L.T.M., Fotiadis D., and Engel A. Applied Physics Letters 88 (2006) 193109
101. Gan Y., Wanless E.J., and Franks G.V. Surface Science 601 (2007) 1064
102. Karrasch S., Hegerl R., Hoh J.H., Baumeister W., and Engel A. Proceedings of the National Academy of Sciences of USA 91 (1994) 836
103. Giessibl F.J. Science 267 (1995) 68
104. Hembacher S., Giessibl F.J., Mannhart J., and Quate C.F. Proceedings of the National Academy of Sciences of USA 100 (2003) 12539
105. Naitoh Y., Takayanagi K., Hirayama H., and Ohsima Y. Surface Science 433-435 (1999) 627
106. Bengu E., Plass R., Marks L.D., Ichihashi T., Ajayan P.M., and Iijima S. Physical Review Letters 77 (1996) 4226
107. Binnig G., Gerber C., Stoll E., Albrecht T.R., and Quate C.F. Europhysics Letters 3 (1987) 1281
108. Marti O., Drake B., and Hansma P.K. Applied Physics Letters 51 (1987) 484
109. Sasaki N., Kobayashi K., and Tsukada M. Physical Review B 54 (1996) 2138
110. Von Toussaint U., Schimmel T., and Küppers J. Surface and Interface Analysis 25 (1997) 620
111. Allers W., Schwarz A., Schwarz U.D., and Wiesendanger R. Applied Surface Science 140 (1999) 247
112. Hölscher H., Allers W., Schwarz U.D., Schwarz A., and Wiesendanger R. Physical Review B 62 (2000) 6967
113. Suzuki Y., Enoki H., and Akiba E. Ultramicroscopy 104 (2005) 226
114. Hembacher S., Giessibl F.J., Mannhart J., and Quate C.F. Physical Review Letters 94 (2005) 1
115. Ashino M., Schwarz A., Hölscher H., Schwarz U.D., and Wiesendanger R. Nanotechnology 16 (2005) S134
116. Atamny F., Spillecke O., and Schlögl R. Physical Chemistry Chemical Physics 1 (1999) 4113
117. Meyer J.C., Geim A.K., Katsnelson M.I., Novoselov K.S., Booth T.J., and Roth S. Nature 446 (2007) 60
118. Shluger A.L., Wilson R.M., and Williams R.T. Physical Review B 49 (1994) 4915
119. Bosbach D., and Rammensee W. Geochimica et Ccsmochimica Acta 58 (1994) 843
120. Schimmel T., Koch T., Küppers J., and Lux-Steiner M. Applied Physics A 68 (1999) 399
121. Castle J.E., Zhdan P.A., and Singjai P. Surface and Interface Analysis 27 (1999) 770
122. Bokern D.G., Hunter K.A., and McGrath K.M. Langmuir 19 (2003) 10019
123. Komiyama M., Li Y.N., and Gu N. Applied Surface Science 237 (2004) 508
124. Sasahara A., Kitamura S., Uetsuka H., and Onishi H. Journal of Physical Chemistry B 108 (2004) 15735
125. Fukuma T., Kilpatrick J.I., and Jarvis S.P. Review of Scientific Instruments 77 (2006) 123703
126. Fukuma T., Higgins M.J., and Jarvis S.P. Physical Review Letters 98 (2007) 106101
127. Jaschke M., Schönherr H., Wolf H., Butt H.-J., Bamberg E., Besocke M.K., and Ringsdorf H. Journal of Physical Chemistry 100 (1996) 2290
128. Kuwahara Y. Physics and Chemistry of Minerals 26 (1999) 198
129. Kuwahara Y. Physics and Chemistry of Minerals 28 (2001) 1
130. Müller D.J., Wu N., and Palczewski K. Pharmacological Reviews 60 (2008) 43
131. Parot P., Dufrêne Y.F., Hinterdorfer P., Le Grimellec C., Navajas D., Pellequer J.L., and Scheuring S. Journal of Molecular Recognition 20 (2007) 418
132. Scheuring S., Boudier T., and Sturgis J.N. Journal of Structural Biology 159 (2007) 268
133. Scheuring S. Current Opinion in Chemical Biology 10 (2006) 387
134. Ubbink J., and Schär-Zammaretti P. Micron 36 (2005) 293
135. Horber J.K.H., and Miles M.J. Science 302 (2003) 1002
136. Dufrêne Y.F. Journal of Bacteriology 184 (2002) 5205
137. Fotiadis D., Scheuring S., Möller S.A., Engel A., and Müller D.J. Micron 33 (2002) 385
138. Dufrêne Y.F., and Lee G.U. Biochimica et Biophysica Acta - Biomembranes 1509 (2000) 14
139. Czajkowsky D.M., Iwamoto H., and Shao Z. Journal of Electron Microscopy 49 (2000) 395
140. Müller D.J., Fotiadis D., and Engel A. FEBS Letters 430 (1998) 105
141. Hoh J.H., and Hansma P.K. Trends in Cell Biology 2 (1992) 208
142. Buzhynskyy N., Hite R.K., Walz T., and Scheuring S. EMBO Reports 8 (2007) 51
143. Scheuring S., and Sturgis J.N. Science 309 (2005) 484
144. Maurice P.A. Colloids and Surfaces A 107 (1996) 57
145. Emerson IV R.J., and Camesano T.A. Ultramicroscopy 106 (2006) 413
146. Edwards H., McGlothlin R., and Elisa U. Journal of Applied Physics 83 (1998) 3952
147. Dai G., Pohlenz F., Xu M., Koenders L., Danzebrink H.-U., and Wilkening G. Measurement Science and Technology 17 (2006) 545
148. Rerkkumsup P., Aketagawa M., Takada K., Watanabe T., and Sadakata S. Review of Scientific Instruments 74 (2003) 1205
149. Kindt J.H., Thompson J.B., Viani M.B., and Hansma P.K. Review of Scientific Instruments 73 (2002) 2305
150. Schiener J., Witt S., Stark M., and Guckenberger R. Review of Scientific Instruments 75 (2004) 2564
151. Schitter G., Fantner G.E., Kindt J.H., Thurner P.J., and Hansma P.K. Proceedings, 2005 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (2005), Institute of Electrical and Electronics Engineers p. 261
152. Hansma P.K., Schitter G., Fantner G.E., and Prater C. Science 314 (2006) 601
153. Hobbs J.K., Vasilev C., and Humphris A.D.L. Analyst 131 (2006) 251
154. Ando T., Uchihashi T., Kodera N., Yamamoto D., Taniguchi M., Miyagi A., and Yamashita H. Journal of Molecular Recognition 20 (2007) 448
155. Ando T., Uchihashi T., Kodera N., Yamamoto D., Miyagi A., Taniguchi M., and Yamashita H. Pflugers Archiv European Journal of Physiology 456 (2008) 211
156. Magnussen O.M., Zitzler L., Gleich B., Vogt M.R., and Behm R.J. Electrochimica Acta 46 (2001) 3725
157. Preiner J., Tang J., Pastushenko V., and Hinterdorfer P. Physical Review Letters 99 (2007) 046102
158. Hölscher H., Ebeling D., and Schwarz U.D. Journal of Applied Physics 99 (2006) 084311
159. Lozano J.R., and Garcia R. Physical Review Letters 100 (2008) 076102
160. Strus M.C., Raman A., Han C.-S., and Nguyen C.V. Nanotechnology 16 (2005) 2482
161. Lee M., and Jhe W. Physical Review Letters 97 (2006) 036104
162. Nie H.Y., and McIntyre N.S. Review of Scientific Instruments 78 (2007) 023701
163. Sahina O. Review of Scientific Instruments 79 (2007) 103707
164. Hölscher H., and Schwarz U.D. International Journal of Non-Linear Mechanics 42 (2007) 608
165. Herruzo E.T., and Garcia R. Applied Physics Letters 91 (2007) 143113
166. Okajima T., Sekiguchi H., Arakawa H., and Ikai A. Applied Surface Science 210 (2003) 68
167. Ebeling D., Hölscher H., Fuchs H., Anczykowski B., and Schwarz U.D. Nanotechnology 17 (2006) S221
168. Ashby P.D. Applied Physics Letters 91 (2007) 254102
169. Gunev I., Varol A., Karaman S., and Basdogan C. Review of Scientific Instruments 78 (2007) 043707
170. Martinez N.F., Patil S., Lozano J.R., and Garcia R. Applied Physics Letters 89 (2006) 153115
171. Patil S., Martinez N.F., Lozano J.R., and Garcia R. Journal of Molecular Recognition 20 (2007) 516
172. Raman A., Melcher J., and Tung R. Nano Today 3 (2008) 20
173. Zhang Y., Zhang Y., Sriram T.S., and Marcus R.B. Applied Physics Letters 69 (1996) 4260
174. Oesterschulze E. Surface and Coatings Technology 97 (1997) 694
175. Tomitori M., and Arai T. Applied Surface Science 140 (1999) 432
176. Grow R.J., Minne S.C., Manalis S.R., and Quate C.F. Journal of Microelectromechanical Systems 11 (2002) 317
177. Alves M.A.R., Takeuti D.F., and Braga E.S. Microelectronics Journal 36 (2005) 51
178. Burt D.P., Dobson P.S., Donaldson L., and Weaver J.M.R. Microelectronic Engineering 85 (2008) 625
179. Neuzil P., and Nagarajan R. Journal of Micromechanics and Microengineering 16 (2006) 1298
180. Zenhausern F., Adrian M., Ten Heggeler-Bordier B., Ardizzoni F., and Descouts P. Journal of Applied Physics 73 (1993) 7232
181. Arai T., Gritschneder S., Tröger L., and Reichling M. Nanotechnology 15 (2004) 1302
182. An T., Eguchi T., Akiyama K., and Hasegawa Y. Applied Physics Letters 87 (2005) 133114
183. Akiyama K., Eguchi T., An T., Fujikawa Y., Yamada-Takamura Y., Sakurai T., and Hasegawa Y. Review of Scientific Instruments 76 (2005) 033705
184. Cockins L., Miyahara Y., Stomp R., and Grutter P. Review of Scientific Instruments 78 (2007) 113706
185. Chen C., Chen L.-H., Gapin A., Jin S., Yuan L., and Liou S.-H. Nanotechnology 19 (2008) 075501
186. Beuret C., Akiyama T., Staufer U., de Rooij N.F., Niedermann P., and Hänni W. Applied Physics Letters 76 (2000) 1621
187. Malavé A., Oesterschulze E., Kulisch W., Trenkler T., Hantschel T., and Vandervorst W. Diamond and Related Materials 8 (1999) 283
188. Malavé A., and Oesterschulzeb E. Review of Scientific Instruments 77 (2006) 043708
189. Kim W.-S., Park K.-M., Park J.J., Chang S.-M., Kim I.-H., Muramatsu H., and Kim J.M. Current Applied Physics 7 (2007) 528
190. Marcus R.B., Ravi T.S., Gmitter T., Chin K., Liu D., Orvis W.J., Ciarlo D.R., Hunt C.E., and Trujillo J. Applied Physics Letters 56 (1990) 236
191. Chattopadhyay S., Chen L.-C., and Chen K.-H. Critical Reviews in Solid State and Materials Sciences 31 (2006) 15
192. Givargizov E.I., Stepanova A.N., Obolenskaya L.N., Mashkova E.S., Molchanov V.A., Givargizov M.E., and Rangelow I.W. Ultramicroscopy 82 (2000) 57
193. Wang S., He Y., Zou J., Cao P., Jiang Y., Huang B., Liu C.T., and Liaw P.K. Journal of Crystal Growth 303 (2007) 574
194. Kado H., Yokoyama K., and Tohda T. Review of Scientific Instruments 63 (1992) 3330
195. Tang Y.B., Cong H.T., Chen Z.G., and Cheng H.M. Applied Physics Letters 86 (2005) 233104
196. Dai H.J., Hafer J.H., Rinzler A.G., Colbert D.T., and Smalley R. Nature 384 (1996) 147
197. Hafner J.H., Cheung C.L., Oosterkamp T.H., and Lieber C.M. Journal of Physical Chemistry B 105 (2001) 745
198. Hafner J.H., Cheung C.L., Woolley A.T., and Lieber C.M. Progress in Biophysics and Molecular Biology 77 (2001) 73
199. Wong S.S., Joselevich E., Woolley A.T., Cheung C.L., and Lieber C.M. Nature 394 (1998) 52
200. Cheung C.L., Hafner J.H., and Lieber C.M. Proceedings of the National Academy of Sciences of USA 97 (2000) 3809
201. Woolley A.T., Cheung C.L., Hafner J.H., and Lieber C.M. Chemistry and Biology 7 (2000) R193
202. Nandhakumar I.S., Gordon-Smith T.J., Attard G.S., and Smith D.C. Small 1 (2005) 406
203. Stevens R.M.D., Frederick N.A., Smith B.L., Morse D.E., Stucky G.D., and Hansma P.K. Nanotechnology 11 (2000) 1
204. Kuwahara S., Akita S., Shirakihara M., Sugai T., Nakayama Y., and Shinohara H. Chemical Physics Letters 426 (2006) 585
205. Martinez J., Yuzvinsky T.D., Fennimore A.M., Zettl A., García R., and Bustamante C. Nanotechnology 16 (2005) 2493
206. Chen L., Cheung C.L., Ashby P.D., and Lieber C.M. Nano Letters 4 (2004) 1725
207. Vezenov D.V., Noy A., Rozsnyai L.F., and Lieber C.M. Journal of the American Chemical Society 119 (1997) 2006
208. Chen I.-C., Chen L.-H., Orme C., Quist A., Lal R., and Jin S. Nanotechnology 17 (2006) 4322
209. Guo L., Wang R., Xu H., and Liang J. Wear 258 (2005) 1836
210. Barwich V. Applied Surface Science 157 (2000) 269
211. Krause O., Bouchiat V., and Bonnot A.M. Journal of Physics: Conference Series 61 (2007) 628
212. Ishikawa M., Yoshimura M., and Ueda K. Physica B 323 (2002) 184
213. Jarvis S.P., Uchihashi T., Ishida T., Tokumoto H., and Nakayama Y. Journal of Physical Chemistry B 104 (2000) 6091
214. Wade L.A., Shapiro I.R., Ma Z., Quake S.R., and Collier C.P. Nano Letters 4 (2004) 725
215. Neves B.R.A., Vilela J.M.C., Russell P.E., Reis A.C.C., and Andrade M.S. Ultramicroscopy 76 (1999) 61
216. Wei Z.Q., Wang C., and Bai C.L. Surface Science 467 (2000) 185
217. Matsko N.B. Ultramicroscopy 107 (2007) 95
218. Weierstall U., and Spence J.C.H. Surface Science 398 (1998) 267
219. Wetzel A., Socoliuc A., Meyer E., Bennewitz R., Gnecco E., and Gerber C. Review of Scientific Instruments 76 (2005) 103701
220. Hund M., and Herold H. Review of Scientific Instruments 78 (2007) 063703