Imaging micro-cracks in gold films: A comparative study of scanning tunneling and atomic force microscopies

Ultramicroscopy

Volumn 76, Issue 1-2, 1999, Pages 61-67

  Neves, B R A ^a   Vilela, J M C ^a   Russell, P E ^b   Reis, A C C ^a   Andrade, M S ^a  

^a FUNDAÇÃO CENTRO TECNOLÓGICO DE MINAS GERAIS   (Brazil)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

Atomic force microscopy; Au film; Contact mode; Intermittent contact mode; Micro cracks; Scanning tunneling microscopy

Indexed keywords

GOLD; SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; CONTROLLED STUDY; DEFORMITY; FILM; IMAGE PROCESSING; INTERMETHOD COMPARISON; SCANNING TUNNELING MICROSCOPY;

EID: 0033049193     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(98)00071-0     Document Type: Article

References (17)

1. D. Sarid, Scanning Force Microscopy, Oxford University, New York 1991.
2. Villarubia J.S. Surf. Sci. 321:1994;287.
3. Junqueira R.M.R., Santos L.C., Marques R.G., Oliveira C.R. V.T.L. Buono; Acta Microscopica. A6:1997;318.
4. Griffith J.E., Grigg D.A., Vasile M.J., Russell P.E., Fitzgerald E.A. J. Vac. Sci. Technol. A 10:1992;672.
5. Reis A.C.C., Neves B.R.A., Andrade M.S., Vilela J.M.C., Junqueira R.M.R., Oliveira C.R. Acta Microscopica. 6 A:1997;262.
6. Lennard-Jones J.E. Trans. Faraday Soc. 28:1932;333.
7. Grutter P., Zimmermann-Edling W., Brodbeck D. Appl. Phys. Lett. 60:1992;2741.
8. Magonov S.N. Appl. Spec. Rev. 28:1993;1.
9. Abraham F.F., Batra J.P. Surf. Sci. 209:1989;L125.
10. DeRose J.A., Revel J.P. Microscopy Microanal. 3:1997;203.
11. Tamayo J., Garcia R. Langmuir. 12:1996;4430.
12. Grigg D.A., Russell P.E., Griffith J.E., Vasile M.J., Fitzgerald E.A. Ultramicroscopy. 42:1996;1616.
13. R.M.R. Junqueira, B.R.A. Neves, R.G. Marques, M.S. Andrade, V.T.L. Buono, C.R. Oliveira, M. Aucouturier, Materia 2 (1998) 7. http://www.coppe.ufrj.br:81/~notimat/materia/Vol2N2/artigo7/artigo.htm.
14. Ximen H., Russell P.E. Ultramicroscopy. 42:1992;1526.
15. Westra K.L., Mitchell A.W., Thomson D.J. J. Appl. Phys. 74:1993;3608.
16. Todd J.D., Pethica J.B. J. Phys. Condens. Matter. 1:1989;9823.
17. Landman U., Luedtke W.D., Burnham N.A., Colton R.J. Sci. 248:1990;454.