Theoretical and experimental evidence for "true" atomic resolution under non-vacuum conditions

Journal of Applied Physics

Volumn 86, Issue 10, 1999, Pages 5537-5540

  Sokolov, I Yu ^a   Henderson, G S ^a   Wicks, F J ^a,b  

^a UNIVERSITY OF TORONTO   (Canada)

^b DEPARTMENT OF NATURAL HISTORY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001123429     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371557     Document Type: Article

References (19)

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4. By "true" atomic resolution we mean images of atoms that are not averaged due to multitip effects.
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8. F. J. Giessibl, Science 267, 68 (1995); M. Ohta et al., J. Appl. Phys. 32, 2980 (1993); Y. Sugawara, M. Ohta, H. Ueyama, and S. Morita, Science 270, 1646 (1995); R. Erlandsson, L. Olsson, and P. Martensson, Phys. Rev. B 54, 8309 (1996); R. Luthi et al., Z. Phys. B: Condens. Matter 100, 165 (1996); N. Nakagiri, M. Suzuki, K. Okiguchi, and H. Sugimura, Surf. Sci. Lett. 373, L329 (1997); S. Kitamura and M. Iwatsuki, Jpn. J. Appl. Phys., Part 2 34, L145 (1995); H. Ueyama, M. Ohta, Y. Sugawara, and S. Morita, J. Appl. Phys. 34, L1086 (1995); T. Ogino, H. Hibino, and Y. Homma, J. Appl. Phys. 35, L668 (1996).
9. F. J. Giessibl, Science 267, 68 (1995); M. Ohta et al., J. Appl. Phys. 32, 2980 (1993); Y. Sugawara, M. Ohta, H. Ueyama, and S. Morita, Science 270, 1646 (1995); R. Erlandsson, L. Olsson, and P. Martensson, Phys. Rev. B 54, 8309 (1996); R. Luthi et al., Z. Phys. B: Condens. Matter 100, 165 (1996); N. Nakagiri, M. Suzuki, K. Okiguchi, and H. Sugimura, Surf. Sci. Lett. 373, L329 (1997); S. Kitamura and M. Iwatsuki, Jpn. J. Appl. Phys., Part 2 34, L145 (1995); H. Ueyama, M. Ohta, Y. Sugawara, and S. Morita, J. Appl. Phys. 34, L1086 (1995); T. Ogino, H. Hibino, and Y. Homma, J. Appl. Phys. 35, L668 (1996).
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11. F. J. Giessibl, Science 267, 68 (1995); M. Ohta et al., J. Appl. Phys. 32, 2980 (1993); Y. Sugawara, M. Ohta, H. Ueyama, and S. Morita, Science 270, 1646 (1995); R. Erlandsson, L. Olsson, and P. Martensson, Phys. Rev. B 54, 8309 (1996); R. Luthi et al., Z. Phys. B: Condens. Matter 100, 165 (1996); N. Nakagiri, M. Suzuki, K. Okiguchi, and H. Sugimura, Surf. Sci. Lett. 373, L329 (1997); S. Kitamura and M. Iwatsuki, Jpn. J. Appl. Phys., Part 2 34, L145 (1995); H. Ueyama, M. Ohta, Y. Sugawara, and S. Morita, J. Appl. Phys. 34, L1086 (1995); T. Ogino, H. Hibino, and Y. Homma, J. Appl. Phys. 35, L668 (1996).
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14. I. Yu. Sokolov, G. S. Henderson, and F. J. Wicks, in Atomic Force Microscopy/Scanning Tunnelling Microscopy 3, edited by Samuel M. Cohen and MarcLa L. Lightbody (Pergamon, New York, in press); I. Yu. Sokolov, G. S. Henderson, and F. J. Wicks, Surf. Sci. 381, L558 (1997).
15. J. R. Hahn, H. Kang, S. Song, and I. C. Jeon, Phys. Rev., 53, R1725 (1996).
16. By "raw" image we mean that no fast Fourier transform filtering (FFT) has been applied. The images have been processed with a single low pass filter, which does not affect any periodicity in the image.
17. The FFT power spectrum is equivalent to the reciprocal lattice image of the surface and should correspond to a LEED image of the {001} plane of anhydrite. FFT filtered images were obtained by passing all observed periodicities in the power spectrum to the inverse FFT image.
18. 0 = 6.238 and is taken from the Cerius2™ software database (Molecular Simulation Incorporated).
19. The simulation with five atoms at the apex (N = 5) could give the impression that it too has reproduced the {001} surface structure. However, the height contrast in this simulation is 0.01 nm and this is at the level of sensitivity of our AFM, and is not likely to be observed above the noise.