Correlating AFM probe morphology to image resolution for single-wall carbon nanotube tips

Nano Letters

Volumn 4, Issue 4, 2004, Pages 725-731

  Wade, Lawrence A ^a,b   Shapiro, Ian R ^c   Ma, Ziyang ^b   Quake, Stephen R ^b   Collier, C Patrick ^c  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b California Institute of Technology   (United States)

^c CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBE;

ARTICLE; CORRELATION ANALYSIS; MORPHOLOGY; NANOTUBE; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 2342613665     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl049976q     Document Type: Article

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