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Volumn 91, Issue 25, 2007, Pages

Gentle imaging of soft materials in solution with amplitude modulation atomic force microscopy: Q control and thermal noise

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATION; ATOMIC FORCE MICROSCOPY; IMAGE PROCESSING; SIGNAL TO NOISE RATIO; THERMAL NOISE;

EID: 37549048561     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2824576     Document Type: Article
Times cited : (31)

References (32)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.