Carbon nanotube as a probe for friction force microscopy

Physica B: Condensed Matter

Volumn 323, Issue 1-4, 2002, Pages 184-186

  Ishikawa, M ^a   Yoshimura, M ^a   Ueda, K ^a  

^a TOYOTA TECHNOLOGICAL INSTITUTE   (Japan)

Author keywords

AFM; Friction; Nanotubes; Probe; SPM

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ATOMIC STRUCTURE; FRICTION; MICA;

FRICTION FORCE MICROSCOPY;

CARBON NANOTUBES;

EID: 0036776659     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(02)00973-0     Document Type: Conference Paper

References (8)