Self-oscillation technique for AFM in liquids

Applied Surface Science

Volumn 210, Issue 1-2 SPEC., 2003, Pages 68-72

  Okajima, Takaharu ^a   Sekiguchi, Hiroshi ^a   Arakawa, Hideo ^a   Ikai, Atsushi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Atomic force microscope; Dynamic force microscope; Imaging in liquid; Self oscillation; Tapping mode

Indexed keywords

ATOMIC FORCE MICROSCOPY; GOLD; IMAGING TECHNIQUES; NATURAL FREQUENCIES; OSCILLATIONS; THIN FILMS;

SELF-OSCILLATIONS;

SURFACE PROPERTIES;

EID: 0037474593     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)01481-2     Document Type: Conference Paper

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