Atomically-resolved imaging by frequency-modulation atomic force microscopy using a quartz length-extension resonator

Applied Physics Letters

Volumn 87, Issue 13, 2005, Pages 1-3

  An, Toshu ^a,b   Eguchi, Toyoaki ^a   Akiyama, Kotone ^c   Hasegawa, Yukio ^c  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FREQUENCY MODULATION; IMAGING TECHNIQUES; ION BEAMS; SILICON COMPOUNDS;

FORCE SENSOR; QUARTZ RESONATOR;

RESONATORS;

EID: 28344450205     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2061850     Document Type: Article

References (15)

1. W. Allers, A. Schwartz, U. D. Schwarz, and R. Wiesendanger, Rev. Sci. Instrum. 69, 221 (1998).
2. S. Hembacher, F. J. Giessibl, and J. Mannhart, Appl. Surf. Sci. 445, 188 (2002).
3. T. Vančura, S. Kicin, T. Ihn, M. Bichler, W. Wegscheider, and K. Ensslin, Appl. Phys. Lett. 83, 2602 (2003).
4. W. H. J. Rensen, N. F. van Hulst, and S. B. Kämmer, Appl. Phys. Lett. 77, 1557 (2000).
5. F. J. Giessibl, H. Bielefeldt, S. Hembacher, and J. Mannhart, Ann. Phys. 10, 887 (2001).
6. T. Eguchi and Y. Hasegawa, Phys. Rev. Lett. 89, 266105 (2002).
7. F. J. Giessibl, Appl. Phys. Lett. 76, 1470 (2000).
8. S. Heike and T. Hashizume, Appl. Phys. Lett. 83, 3620 (2003).
9. T. R. Albrecht, P. Grütter, D. Horne, and D. Rugar, J. Appl. Phys. 69, 668 (1991).
10. K. Akiyama, T. Eguchi, T. An, Y. Fujikawa, Y. Yamada-Takamura, T. Sakurai, and Y. Hasegawa, Rev. Sci. Instrum. 76, 033705 (2005).
11. A. Michels, F. Meinen, T. Murdfield, W. Göhde, U. C. Fischer, E. Beckmann, and H. Fuchs, Thin Solid Films 264, 172 (1995).
12. H. Ueyama, Y. Sugawara, and S. Morita, Appl. Phys. A: Mater. Sci. Process. 66, S295 (1998).
13. T. Sakurai, T. Hashizume, I. Kamiya, Y. Hasegawa, T. Ide, M. Miyao, I. Sumita, A. Sakai, and S. Hyodo, J. Vac. Sci. Technol. A 7, 1684 (1989).
14. E. W. Müller and T. T. Tsong, Field Ion Microscopy: Principles and Applications (Elsevier, New York, 1969).
15. T. Eguchi, Y. Fujikawa, K. Akiyama, T. An, M. Ono, T. Hashimoto, Y. Morikawa, K. Terakura, T. Sakurai, M. G. Lagally, and Y. Hasegawa, Phys. Rev. Lett. 93, 266102 (2004).