AFM's path to atomic resolution

Materials Today

Volumn 8, Issue 5, 2005, Pages 32-41

  Giessibl, Franz J ^a  

^a UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; ATTENUATION; IMAGING TECHNIQUES; OPTICAL RESOLVING POWER; OSCILLATIONS; PROFILOMETRY; QUANTUM THEORY; SCANNING TUNNELING MICROSCOPY; SIGNAL TO NOISE RATIO; SILICON;

ATOMIC IMAGING; ATOMIC RESOLUTION; MECHANICAL PROFILING; SILICON CANTILEVERS;

ATOMIC FORCE MICROSCOPY;

EID: 17744373911     PISSN: 13697021     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-7021(05)00844-8     Document Type: Article

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