A quantitative comparison of resolution, scanning speed and lifetime behavior of CVD grown Single Wall Carbon Nanotubes and silicon SPM probes using spectral methods

Journal of Physics: Conference Series

Volumn 61, Issue 1, 2007, Pages 628-632

  Krause, O ^a   Bouchiat, V ^b   Bonnot, A M ^b  

^a NANOWORLD SERVICES GMBH   (Germany)

^b LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34247507312     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/61/1/126     Document Type: Article

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